Anthony P. Wagner

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Auburn, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Temperature-measurement probe
- Patent number 10,054,498
- Issue date Aug 21, 2018
- Welch Allyn, Inc.
- Craig M. Meyerson
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-measurement probe
- Patent number 9,719,862
- Issue date Aug 1, 2017
- Welch Allyn, Inc.
- Craig M. Meyerson
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-measurement probe
- Patent number 8,794,829
- Issue date Aug 5, 2014
- Welch Allyn, Inc.
- Craig M. Meyerson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE-MEASUREMENT PROBE
- Publication number 20170328787
- Publication date Nov 16, 2017
- Welch Allyn, Inc.
- Craig M. Meyerson
- G01 - MEASURING TESTING
Information Patent Application
Temperature-Measurement Probe
- Publication number 20140297215
- Publication date Oct 2, 2014
- Craig M. Meyerson
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE-MEASUREMENT PROBE
- Publication number 20110158283
- Publication date Jun 30, 2011
- Welch Allyn, Inc.
- Craig M. Meyerson
- G01 - MEASURING TESTING