Anton S. Khomenko

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Lansing, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning interferometry technique for through-thickness evaluation...
- Patent number 9,500,468
- Issue date Nov 22, 2016
- Board of Trustees of Michigan State University
- Anton S. Khomenko
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning interferometry technique for through-thickness evaluation...
- Publication number 20160054116
- Publication date Feb 25, 2016
- Board of Trustees of Michigan State University
- Anton S. Khomenko
- G01 - MEASURING TESTING