Anton Vogl

Person

Sinzing, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for measurement of a plurality of semiconductor c...
- Patent number 10,867,873
- Issue date Dec 15, 2020
- OSRAM OLED GmbH
- Holger Specht
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for inspecting an optoelectronic component arrang...
- Patent number 10,288,671
- Issue date May 14, 2019
- Osram Opto Semiconductors GmbH
- Robert Schulz
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring and optimizing an optoelectronic co...
- Patent number 10,132,855
- Issue date Nov 20, 2018
- Osram Opto Semiconductors GmbH
- Robert Schulz
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Thin-film semiconductor body with electronmagnetic radiation outcou...
- Patent number 9,972,748
- Issue date May 15, 2018
- Osram Opto Semiconductors GmbH
- Christian Leirer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a thin-film semiconductor body and thin-film s...
- Patent number 9,202,967
- Issue date Dec 1, 2015
- Osram Opto Semiconductors GmbH
- Christian Leirer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and Device for Measurement of a Plurality of Semiconductor C...
- Publication number 20190189527
- Publication date Jun 20, 2019
- Osram Opto Semiconductors GmbH
- Holger Specht
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Device for Inspecting an Optoelectronic Component
- Publication number 20180024185
- Publication date Jan 25, 2018
- Osram Opto Semiconductors GmbH
- Robert Schulz
- G01 - MEASURING TESTING
Information Patent Application
Method for Producing a Thin-Film Semiconductor Body and Thin-Film S...
- Publication number 20160049550
- Publication date Feb 18, 2016
- Osram Opto Semiconductors GmbH
- Christian Leirer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Device for Measuring and Optimizing an Optoelectronic Co...
- Publication number 20160003890
- Publication date Jan 7, 2016
- Osram Opto Semiconductors GmbH
- Robert Schulz
- G01 - MEASURING TESTING
Information Patent Application
Method for Producing a Thin-Film Semiconductor Body and Thin-Film S...
- Publication number 20140061694
- Publication date Mar 6, 2014
- Osram Opto Semiconductors GmbH
- Christian Leirer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Producing an Optoelectronic Semiconductor Chip
- Publication number 20140057417
- Publication date Feb 27, 2014
- Osram Opto Semiconductors GmbH
- Christian Leirer
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Method and device for measurement of a plurality of semiconductor c...

Method and device for inspecting an optoelectronic component arrang...

Method and device for measuring and optimizing an optoelectronic co...

Thin-film semiconductor body with electronmagnetic radiation outcou...

Method for producing a thin-film semiconductor body and thin-film s...

Patents Applicationslast 30 patents

Method and Device for Measurement of a Plurality of Semiconductor C...

Method and Device for Inspecting an Optoelectronic Component

Method for Producing a Thin-Film Semiconductor Body and Thin-Film S...

Method and Device for Measuring and Optimizing an Optoelectronic Co...

Method for Producing a Thin-Film Semiconductor Body and Thin-Film S...

Method for Producing an Optoelectronic Semiconductor Chip