Antonio H. Chan

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Brossard, CA

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Patents Grantslast 30 patents

Information Patent Grant
System and method for testing integrated circuits
- Patent number 7,242,209
- Issue date Jul 10, 2007
- DFT Microsystems, Inc.
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Timing measurement device using a component-invariant vernier delay...
- Patent number 6,850,051
- Issue date Feb 1, 2005
- McGill University
- Gordon W. Roberts
- G04 - HOROLOGY

Patents Applicationslast 30 patents

Information Patent Application
System and method for testing integrated circuits
- Publication number 20050253617
- Publication date Nov 17, 2005
- DFT Microsystems Canada, Inc.
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Application
Timing measurement device using a component-invariant vernier delay...
- Publication number 20030006750
- Publication date Jan 9, 2003
- McGill University
- Gordon W. Roberts
- G04 - HOROLOGY