Antonio Mani

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Leuven, BE

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Patents Grantslast 30 patents

Information Patent Grant
Measurement of overlay error using device inspection system
- Patent number 11,784,097
- Issue date Oct 10, 2023
- KLA-Tencor Corporation
- Choon Hoong Hoo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement of overlay error using device inspection system
- Patent number 10,943,838
- Issue date Mar 9, 2021
- KLA-Tencor Corporation
- Choon Hoong Hoo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identifying nuisances and defects of interest in defects detected o...
- Patent number 10,699,926
- Issue date Jun 30, 2020
- KLA-Tencor Corp.
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology guided inspection sample shaping of optical inspection re...
- Patent number 10,598,617
- Issue date Mar 24, 2020
- KLA-Tencor Corporation
- Kaushik Sah
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement of Overlay Error Using Device Inspection System
- Publication number 20210159128
- Publication date May 27, 2021
- KLA-Tencor Corporation
- Choon Hoong Hoo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement of Overlay Error Using Device Inspection System
- Publication number 20190252270
- Publication date Aug 15, 2019
- KLA-Tencor Corporation
- Choon Hoong Hoo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Identifying Nuisances and Defects of Interest in Defects Detected o...
- Publication number 20190067060
- Publication date Feb 28, 2019
- KLA-Tencor Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Guided Inspection Sample Shaping of Optical Inspection Re...
- Publication number 20180321168
- Publication date Nov 8, 2018
- KLA-Tencor Corporation
- Kaushik Sah
- G01 - MEASURING TESTING