Anuj Pandey

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Delhi, IN

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor fabrication process parameter determination using a g...
- Patent number 12,131,103
- Issue date Oct 29, 2024
- KLA Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Care area based swath speed for throughput and sensitivity improvement
- Patent number 11,776,859
- Issue date Oct 3, 2023
- KLA Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image noise reduction using stacked denoising auto-encoder
- Patent number 11,170,475
- Issue date Nov 9, 2021
- KLA Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Super-resolution defect review image generation through generative...
- Patent number 10,949,964
- Issue date Mar 16, 2021
- KLA Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR FABRICATION PROCESS PARAMETER DETERMINATION USING A G...
- Publication number 20210303757
- Publication date Sep 30, 2021
- KLA Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image Noise Reduction Using Stacked Denoising Auto-Encoder
- Publication number 20200226722
- Publication date Jul 16, 2020
- KLA Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Care Area Based Swath Speed for Throughput and Sensitivity Improvement
- Publication number 20200203237
- Publication date Jun 25, 2020
- KLA Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Super-Resolution Defect Review Image Generation Through Generative...
- Publication number 20200098101
- Publication date Mar 26, 2020
- KLA-Tencor Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING