Anuja Banerjee

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Transition fault testing of source synchronous interface
- Patent number 9,234,942
- Issue date Jan 12, 2016
- Apple Inc.
- Anuja Banerjee
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic scan chain grouping
- Patent number 8,301,947
- Issue date Oct 30, 2012
- Apple Inc.
- Samy Makar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Transition Fault Testing of Source Synchronous Interface
- Publication number 20140088912
- Publication date Mar 27, 2014
- Apple Inc.
- Anuja Banerjee
- G01 - MEASURING TESTING