Anupama Anlruddha Agashe

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Patents Grantslast 30 patents

Information Patent Grant
At-speed ATPG testing and apparatus for SoC designs having multiple...
- Patent number 7,134,061
- Issue date Nov 7, 2006
- Texas Instruments Incorporated
- Anupama Aniruddha Agashe
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism to enhance observability of integrated circuit failures d...
- Patent number 7,120,842
- Issue date Oct 10, 2006
- Texas Instruments Incorporated
- Gordhan Barevadia
- G11 - INFORMATION STORAGE
Information Patent Grant
Mixed-signal core design for concurrent testing of mixed-signal, an...
- Patent number 6,925,408
- Issue date Aug 2, 2005
- Texas Instruments Incorporated
- Amit Premy
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Mechanism to enhance observability of integrated circuit failures d...
- Publication number 20050066243
- Publication date Mar 24, 2005
- Gordhan Barevadia
- G01 - MEASURING TESTING
Information Patent Application
Mixed-signal core design for concurrent testing of mixed-signal, an...
- Publication number 20050065747
- Publication date Mar 24, 2005
- Amit Premy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
At-speed ATPG testing and apparatus for SoC designs having multiple...
- Publication number 20050055615
- Publication date Mar 10, 2005
- Anupama Anlruddha Agashe
- G01 - MEASURING TESTING