Anurag TIWARI

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Noida, IN

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Patents Grantslast 30 patents

Information Patent Grant
Referenceless clock and data recovery circuit
- Patent number 9,325,490
- Issue date Apr 26, 2016
- STMicroelectronics International N.V.
- Anurag Tiwari
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Crystal oscillator circuit
- Patent number 8,653,898
- Issue date Feb 18, 2014
- STMicroelectronics International N.V.
- Abhirup Lahiri
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for on-chip jitter and duty cycle measurement
- Patent number 8,456,195
- Issue date Jun 4, 2013
- STMicroelectronics International N.V.
- Kallol Chatterjee
- G01 - MEASURING TESTING
Information Patent Grant
System and method for on-chip duty cycle measurement
- Patent number 8,212,547
- Issue date Jul 3, 2012
- STMicroelectronics International N.V.
- Anurag Ramesh Tiwari
- G01 - MEASURING TESTING
Information Patent Grant
System and method for on-chip jitter and duty cycle measurement
- Patent number 8,159,272
- Issue date Apr 17, 2012
- STMicroelectronics Pvt. Ltd.
- Kallol Chatterjee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REFERENCELESS CLOCK AND DATA RECOVERY CIRCUIT
- Publication number 20150270947
- Publication date Sep 24, 2015
- STMicroelectronics International N.V
- Anurag TIWARI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR ON-CHIP JITTER AND DUTY CYCLE MEASUREMENT
- Publication number 20120218002
- Publication date Aug 30, 2012
- STMICROELECTRONICS PVT. LTD.
- Kallol CHATTERJEE
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL OSCILLATOR CIRCUIT
- Publication number 20120161888
- Publication date Jun 28, 2012
- STMICROELECTRONICS PVT. LTD.
- Abhirup LAHIRI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM AND METHOD FOR ON-CHIP JITTER AND DUTY CYCLE
- Publication number 20100171529
- Publication date Jul 8, 2010
- STMICROELECTRONICS PVT. LTD.
- Kallol CHATTERJEE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ON-CHIP DUTY CYCLE MEASUREMENT
- Publication number 20100019757
- Publication date Jan 28, 2010
- STMicroelectronics Pvt. Ltd.
- Anurag Ramesh Tiwari
- G01 - MEASURING TESTING