Anwar Hossain

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Port Fefferson Station, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detector
- Patent number 10,502,842
- Issue date Dec 10, 2019
- Brookhaven Science Associates, LLC
- Utpal N. Roy
- G01 - MEASURING TESTING
Information Patent Grant
Production and distribution of dilute species in semiconducting mat...
- Patent number 9,437,692
- Issue date Sep 6, 2016
- Brookhaven Science Associates, LLC
- Ralph B. James
- C30 - CRYSTAL GROWTH
Information Patent Grant
Radiation detector device for rejecting and excluding incomplete ch...
- Patent number 9,335,423
- Issue date May 10, 2016
- Brookhaven Science Associates, LLC
- Aleksey E. Bolotnikov
- G01 - MEASURING TESTING
Information Patent Grant
Array of virtual Frisch-grid detectors with common cathode and redu...
- Patent number 9,121,953
- Issue date Sep 1, 2015
- Brookhaven Science Associates, LLC
- Aleksey E. Bolotnikov
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid anode for semiconductor radiation detectors
- Patent number 8,586,936
- Issue date Nov 19, 2013
- Brookhaven Science Associates, LLC
- Ge Yang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RADIATION DETECTOR
- Publication number 20180024254
- Publication date Jan 25, 2018
- Brookhaven Science Associates, LLC
- UTPAL N. ROY
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR DEVICE FOR REJECTING AND EXCLUDING INCOMPLETE CH...
- Publication number 20140231657
- Publication date Aug 21, 2014
- Brookhaven Science Associates, LLC
- Aleksey Bolotnikov
- G01 - MEASURING TESTING
Information Patent Application
ARRAY OF VIRTUAL FRISCH-GRID DETECTORS WITH COMMON CATHODE AND REDU...
- Publication number 20130126746
- Publication date May 23, 2013
- Brookhaven Science Associates, LLC
- Aleksey E. Bolotnikov
- G01 - MEASURING TESTING
Information Patent Application
Hybrid Anode for Semiconductor Radiation Detectors
- Publication number 20110272589
- Publication date Nov 10, 2011
- Brookhaven Science Associates, LLC
- Ge Yang
- G01 - MEASURING TESTING