Aoi YAMAUCHI

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Patents Applicationslast 30 patents

Information Patent Application
Depth Measurement Device, Depth Measurement System, and Depth Index...
- Publication number 20240240937
- Publication date Jul 18, 2024
- Hitachi High-Tech Corporation
- Aoi YAMAUCHI
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device, Charged Particle Beam System, and Adj...
- Publication number 20230386781
- Publication date Nov 30, 2023
- HITACHI HIGH-TECH CORPORATION
- Zhao JINYU
- H01 - BASIC ELECTRIC ELEMENTS