Aparna Prabhakar

Person

White Plains, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
High performance compliant wafer test probe
- Patent number 9,335,346
- Issue date May 10, 2016
- GLOBALFOUNDRIES Inc.
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Grant
Structure and design of concentrator solar cell assembly receiver s...
- Patent number 9,231,139
- Issue date Jan 5, 2016
- International Business Machines Corporation
- Michael A. Gaynes
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Electrochemical liquid cell apparatus
- Patent number 8,852,408
- Issue date Oct 7, 2014
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Grant
Laser ablation of adhesive for integrated circuit fabrication
- Patent number 8,679,280
- Issue date Mar 25, 2014
- International Business Machines Corporation
- Bing Dang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High performance compliant wafer test probe
- Patent number 8,487,304
- Issue date Jul 16, 2013
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Grant
Laser ablation for integrated circuit fabrication
- Patent number 8,419,895
- Issue date Apr 16, 2013
- International Business Machines Corporation
- Bing Dang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
SER testing for an IC chip using hot underfill
- Patent number 8,288,177
- Issue date Oct 16, 2012
- International Business Machines Corporation
- Michael Gaynes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High Performance Compliant Wafer Test Probe
- Publication number 20120329295
- Publication date Dec 27, 2012
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND DESIGN OF CONCENTRATOR SOLAR CELL ASSEMBLY RECEIVER S...
- Publication number 20120138145
- Publication date Jun 7, 2012
- International Business Machines Corporation
- Michael A. Gaynes
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
SER Testing for an IC Chip Using Hot Underfill
- Publication number 20120045853
- Publication date Feb 23, 2012
- International Business Machines Corporation
- Michael Gaynes
- G01 - MEASURING TESTING
Information Patent Application
Handler Attachment for Integrated Circuit Fabrication
- Publication number 20110290402
- Publication date Dec 1, 2011
- International Business Machines Corporation
- Paul Andry
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Laser Ablation of Adhesive for Integrated Circuit Fabrication
- Publication number 20110290413
- Publication date Dec 1, 2011
- International Business Machines Corporation
- Bing Dang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Laser Ablation for Integrated Circuit Fabrication
- Publication number 20110290406
- Publication date Dec 1, 2011
- International Business Machines Corporation
- Bing Dang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
High Performance Compliant Wafer Test Probe
- Publication number 20110266539
- Publication date Nov 3, 2011
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
ELECTROCHEMICAL LIQUID CELL APPARATUS
- Publication number 20100276277
- Publication date Nov 4, 2010
- S. Jay Chey
- G01 - MEASURING TESTING

Aparna Prabhakar

Person

Patents Grantslast 30 patents

High performance compliant wafer test probe

Structure and design of concentrator solar cell assembly receiver s...

Electrochemical liquid cell apparatus

Laser ablation of adhesive for integrated circuit fabrication

High performance compliant wafer test probe

Laser ablation for integrated circuit fabrication

SER testing for an IC chip using hot underfill

Patents Applicationslast 30 patents

High Performance Compliant Wafer Test Probe

STRUCTURE AND DESIGN OF CONCENTRATOR SOLAR CELL ASSEMBLY RECEIVER S...

SER Testing for an IC Chip Using Hot Underfill

Handler Attachment for Integrated Circuit Fabrication

Laser Ablation of Adhesive for Integrated Circuit Fabrication

Laser Ablation for Integrated Circuit Fabrication

High Performance Compliant Wafer Test Probe

ELECTROCHEMICAL LIQUID CELL APPARATUS