TREA

Aram P. Schiffman

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  • San Ramon, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Photon efficient scanner
    • Patent number 7,016,087
    • Issue date Mar 21, 2006
    • Becton Dickinson and Company
    • David M. Heffelfinger
    • G01 - MEASURING TESTING
  • Information Patent Grant

    System for high throughput analysis
    • Patent number 6,750,457
    • Issue date Jun 15, 2004
    • Becton Dickinson and Company
    • David M. Heffelfinger
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    System for high throughput analysis
    • Publication number 20030044967
    • Publication date Mar 6, 2003
    • David M. Heffelfinger
    • G01 - MEASURING TESTING
  • Information Patent Application

    Photon efficient scanner
    • Publication number 20030030850
    • Publication date Feb 13, 2003
    • David M. Heffelfinger
    • G01 - MEASURING TESTING