Archibald Allen

Person

Shelburne, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for prediction random defect yields of integrated circuits w...
- Patent number 6,738,954
- Issue date May 18, 2004
- International Business Machines Corporation
- Archibald J. Allen
- G01 - MEASURING TESTING
Information Patent Grant
Optical Proximity Correction Structures Having Decoupling Capacitors
- Patent number 6,429,469
- Issue date Aug 6, 2002
- International Business Machines Corporation
- Archibald J. Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buried butted contact and method for fabricating
- Patent number 6,335,272
- Issue date Jan 1, 2002
- International Business Machines Corporation
- Archibald Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Incremental method for critical area and critical region computatio...
- Patent number 6,247,853
- Issue date Jun 19, 2001
- International Business Machines Corporation
- Evanthia Papadopoulou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buried butted contact and method for fabricating
- Patent number 6,153,934
- Issue date Nov 28, 2000
- International Business Machines Corporation
- Archibald Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FET device containing a conducting sidewall spacer for local interc...
- Patent number 6,140,171
- Issue date Oct 31, 2000
- International Business Machines Corporation
- Archibald John Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device contact structure and method for fabricating same
- Patent number 6,090,673
- Issue date Jul 18, 2000
- International Business Machines Corporation
- Archibald J. Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hot-electron programmable latch for integrated circuit fuse applica...
- Patent number 6,038,168
- Issue date Mar 14, 2000
- International Business Machines Corporation
- Archibald J. Allen
- G11 - INFORMATION STORAGE

Archibald Allen

Person

Patents Grantslast 30 patents

Method for prediction random defect yields of integrated circuits w...

Optical Proximity Correction Structures Having Decoupling Capacitors

Buried butted contact and method for fabricating

Incremental method for critical area and critical region computatio...

Buried butted contact and method for fabricating

FET device containing a conducting sidewall spacer for local interc...

Device contact structure and method for fabricating same

Hot-electron programmable latch for integrated circuit fuse applica...