Ardis Liang

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor hot-spot and process-window discovery combining optic...
- Patent number 11,055,840
- Issue date Jul 6, 2021
- KLA Corporation
- Ardis Liang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for defect classification based on electrical des...
- Patent number 10,209,628
- Issue date Feb 19, 2019
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive nuisance filter
- Patent number 9,835,566
- Issue date Dec 5, 2017
- KLA-Tencor Corp.
- Ardis Liang
- G01 - MEASURING TESTING
Information Patent Grant
Methods for generating a standard reference die for use in a die to...
- Patent number 8,204,296
- Issue date Jun 19, 2012
- KLA-Tencor Corp.
- Kris Bhaskar
- G01 - MEASURING TESTING
Information Patent Grant
Methods for generating a standard reference die for use in a die to...
- Patent number 7,796,804
- Issue date Sep 14, 2010
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for analyzing defects on a sample
- Patent number 7,345,753
- Issue date Mar 18, 2008
- KLA-Tencor Technologies Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER SIGNATURE LOCAL MAXIMA VIA CLUSTERING FOR METROLOGY GUIDED IN...
- Publication number 20240362765
- Publication date Oct 31, 2024
- KLA Corporation
- Alan Davila
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Hot-Spot and Process-Window Discovery Combining Optic...
- Publication number 20210042908
- Publication date Feb 11, 2021
- KLA Corporation
- Ardis Liang
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Defect Classification Based on Electrical Des...
- Publication number 20170344695
- Publication date Nov 30, 2017
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive Nuisance Filter
- Publication number 20160258879
- Publication date Sep 8, 2016
- KLA-Tencor Corporation
- Ardis Liang
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR GENERATING A STANDARD REFERENCE DIE FOR USE IN A DIE TO...
- Publication number 20100329540
- Publication date Dec 30, 2010
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR GENERATING A STANDARD REFERENCE DIE FOR USE IN A DIE TO...
- Publication number 20090041332
- Publication date Feb 12, 2009
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and methods for analyzing defects on a sample
- Publication number 20060102839
- Publication date May 18, 2006
- KLA-Tencor Technologies, Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING

Ardis Liang

Person

Patents Grantslast 30 patents

Semiconductor hot-spot and process-window discovery combining optic...

System and method for defect classification based on electrical des...

Adaptive nuisance filter

Methods for generating a standard reference die for use in a die to...

Methods for generating a standard reference die for use in a die to...

Apparatus and methods for analyzing defects on a sample

Patents Applicationslast 30 patents

WAFER SIGNATURE LOCAL MAXIMA VIA CLUSTERING FOR METROLOGY GUIDED IN...

Semiconductor Hot-Spot and Process-Window Discovery Combining Optic...

System and Method for Defect Classification Based on Electrical Des...

Adaptive Nuisance Filter

METHODS FOR GENERATING A STANDARD REFERENCE DIE FOR USE IN A DIE TO...

METHODS FOR GENERATING A STANDARD REFERENCE DIE FOR USE IN A DIE TO...

Apparatus and methods for analyzing defects on a sample