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Ares J. Rosakis
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Altadena, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Surface characterization based on optical phase shifting interferom...
Patent number
7,990,543
Issue date
Aug 2, 2011
California Institute of Technology
Michael Mello
G01 - MEASURING TESTING
Information
Patent Grant
Characterizing curvatures and stresses in thin-film structures on s...
Patent number
7,966,135
Issue date
Jun 21, 2011
California Institute of Technology
Ares J. Rosakis
G01 - MEASURING TESTING
Information
Patent Grant
Measuring stresses in multi-layer thin film systems with variable f...
Patent number
7,930,113
Issue date
Apr 19, 2011
California Institute of Technology
Yonggang Huang
G01 - MEASURING TESTING
Information
Patent Grant
Surface characterization based on lateral shearing of diffracted wa...
Patent number
7,538,891
Issue date
May 26, 2009
California Institute of Technology
Michael Mello
G01 - MEASURING TESTING
Information
Patent Grant
Techniques and devices for characterizing spatially non-uniform cur...
Patent number
7,487,050
Issue date
Feb 3, 2009
California Institute of Technology
Ares J. Rosakis
G01 - MEASURING TESTING
Information
Patent Grant
Full-field optical measurements of surface properties of panels, su...
Patent number
7,369,251
Issue date
May 6, 2008
Ultratech, Inc.
Ares J. Rosakis
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for analyzing non-uniform curvatures and stresses in thi...
Patent number
7,363,173
Issue date
Apr 22, 2008
California Institute of Technology
Ares J. Rosakis
G01 - MEASURING TESTING
Information
Patent Grant
Systems for measuring stresses in line features formed on substrates
Patent number
6,924,497
Issue date
Aug 2, 2005
California Institute of Technology
Subra Suresh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Determining large deformations and stresses of layered and graded s...
Patent number
6,781,702
Issue date
Aug 24, 2004
California Institute of Technology
Antonios Giannakopoulos
G01 - MEASURING TESTING
Information
Patent Grant
Real-time evaluation of stress fields and properties in line featur...
Patent number
6,600,565
Issue date
Jul 29, 2003
California Institute of Technology
Subra Suresh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Coherent gradient sensing ellipsometer
Patent number
6,469,788
Issue date
Oct 22, 2002
California Institute of Technology
David A. Boyd
G01 - MEASURING TESTING
Information
Patent Grant
High speed infrared imaging system and method
Patent number
6,268,883
Issue date
Jul 31, 2001
California Institute of Technology
Alan T. Zehnder
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Coherent gradient sensing method and system for measuring surface c...
Patent number
6,031,611
Issue date
Feb 29, 2000
California Institute of Technology
Ares J. Rosakis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Characterizing Curvatures and Stresses in Thin-Film Structures on S...
Publication number
20070180919
Publication date
Aug 9, 2007
California Institute of Technology
Ares J. Rosakis
G01 - MEASURING TESTING
Information
Patent Application
Techniques and devices for characterizing spatially non-uniform cur...
Publication number
20060276977
Publication date
Dec 7, 2006
Ares J. Rosakis
G01 - MEASURING TESTING
Information
Patent Application
Techniques for analyzing non-uniform curvatures and stresses in thi...
Publication number
20050278126
Publication date
Dec 15, 2005
Ares J. Rosakis
G01 - MEASURING TESTING
Information
Patent Application
Analysis and monitoring of stresses in embedded lines and vias inte...
Publication number
20050030551
Publication date
Feb 10, 2005
Ares J. Rosakis
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Optical characterization of surfaces and plates
Publication number
20050007601
Publication date
Jan 13, 2005
Ares J. Rosakis
G01 - MEASURING TESTING
Information
Patent Application
Full-field optical measurements of surface properties of panels, su...
Publication number
20040257587
Publication date
Dec 23, 2004
Ares J. Rosakis
G01 - MEASURING TESTING
Information
Patent Application
Real-time evaluation of stress fields and properties in line featur...
Publication number
20040075825
Publication date
Apr 22, 2004
Subra Suresh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Determining large deformations and stresses of layered and graded s...
Publication number
20030106378
Publication date
Jun 12, 2003
Antonios Giannakopoulos
G01 - MEASURING TESTING
Information
Patent Application
Coherent gradient sensing ellipsometer
Publication number
20020012122
Publication date
Jan 31, 2002
David A. Boyd
G01 - MEASURING TESTING