Ari KUUKKALA

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Turku, FI

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Patents Grantslast 30 patents

Information Patent Grant
Multiplexed thermal control wafer and coldplate
- Patent number 12,259,428
- Issue date Mar 25, 2025
- AEM SINGAPORE PTE. LTD.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexed thermal control wafer and coldplate
- Patent number 12,000,885
- Issue date Jun 4, 2024
- AEM SINGAPORE PTE. LTD.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Testing device
- Patent number 11,226,364
- Issue date Jan 18, 2022
- Afore Oy
- Aki Junes
- G01 - MEASURING TESTING
Information Patent Grant
Testing device includes radiation shields for testing integrated ci...
- Patent number 11,181,574
- Issue date Nov 23, 2021
- Afore Oy
- Aki Junes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Testing Device
- Publication number 20200348356
- Publication date Nov 5, 2020
- Afore Oy
- Aki JUNES
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE
- Publication number 20200348357
- Publication date Nov 5, 2020
- Afore Oy
- Aki JUNES
- G01 - MEASURING TESTING