Arie Jeffrey Maria Den Boef

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Waalre, NL

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Patents Applicationslast 30 patents

Information Patent Application
Inspection method and apparatus, lithographic apparatus, lithograph...
- Publication number 20080037134
- Publication date Feb 14, 2008
- ASML NETHERLANDS B.V.
- Arie Jeffrey Maria Den Boef
- G02 - OPTICS
Information Patent Application
Optical metrology system and metrology mark characterization device
- Publication number 20070153275
- Publication date Jul 5, 2007
- ASML NETHERLANDS B.V.
- Nicolaas Petrus Van Der Aa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY