Ariel Ben-Porath

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Rehovot, IL

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Patents Grantslast 30 patents

Information Patent Grant
Automatic defect classification with invariant core classes
- Patent number 6,987,873
- Issue date Jan 17, 2006
- Applied Materials, Inc.
- Ariel Ben-Porath
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid invariant adaptive automatic defect classification
- Patent number 6,922,482
- Issue date Jul 26, 2005
- Applied Materials, Inc.
- Ariel Ben-Porath
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Kill index analysis for automatic defect classification in semicond...
- Patent number 6,673,657
- Issue date Jan 6, 2004
- Applied Materials, Inc.
- Ayelet Pnueli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for directing a miller
- Patent number 6,670,610
- Issue date Dec 30, 2003
- Applied Materials, Inc.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Kill index analysis for automatic defect classification in semicond...
- Patent number 6,605,478
- Issue date Aug 12, 2003
- Appleid Materials, Inc,
- Ayelet Pnueli
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Kill index analysis for automatic defect classification in semicond...
- Publication number 20030207519
- Publication date Nov 6, 2003
- Applied Materials, Inc.
- Ayelet Pnueli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for directing a miller
- Publication number 20030098416
- Publication date May 29, 2003
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Kill index analysis for automatic defect classification in semicond...
- Publication number 20030017664
- Publication date Jan 23, 2003
- Applied Materials, Inc.
- Ayelet Pnueli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Kill index analysis for automatic defect classification in semicond...
- Publication number 20020142522
- Publication date Oct 3, 2002
- Ayelet Pnueli
- H01 - BASIC ELECTRIC ELEMENTS