Ariel SHKALIM

Person

D.N. Sade-Gat, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Mask inspection of a semiconductor specimen
- Patent number 11,983,867
- Issue date May 14, 2024
- Applied Materials Israel Ltd.
- Ariel Shkalim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining a critical dimension variation of a pattern
- Patent number 11,756,188
- Issue date Sep 12, 2023
- Applied Materials Israel Ltd.
- Vadim Vereschagin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspection of a semiconductor specimen
- Patent number 11,348,224
- Issue date May 31, 2022
- Applied Materials Israel Ltd.
- Ariel Shkalim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining a critical dimension variation of a pattern
- Patent number 11,276,160
- Issue date Mar 15, 2022
- Applied Materials Israel Ltd.
- Vadim Vereschagin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of generating an examination recipe and system thereof
- Patent number 10,290,087
- Issue date May 14, 2019
- Applied Materials Israel Ltd.
- Ariel Shkalim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, methods and computer program products for signature detection
- Patent number 9,613,255
- Issue date Apr 4, 2017
- Applied Materials Israel Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION
- Publication number 20230131950
- Publication date Apr 27, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ronen MADMON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION
- Publication number 20230080151
- Publication date Mar 16, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220254000
- Publication date Aug 11, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN
- Publication number 20220198639
- Publication date Jun 23, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Vadim VERESCHAGIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20210073963
- Publication date Mar 11, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN
- Publication number 20200327652
- Publication date Oct 15, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Vadim VERESCHAGIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF GENERATING AN EXAMINATION RECIPE AND SYSTEM THEREOF
- Publication number 20190080447
- Publication date Mar 14, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS, METHODS AND COMPUTER PROGRAM PRODUCTS FOR SIGNATURE DETECTION
- Publication number 20160292492
- Publication date Oct 6, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Moshe AMZALEG
- G06 - COMPUTING CALCULATING COUNTING

Ariel SHKALIM

Person

Patents Grantslast 30 patents

Mask inspection of a semiconductor specimen

Determining a critical dimension variation of a pattern

Mask inspection of a semiconductor specimen

Determining a critical dimension variation of a pattern

Method of generating an examination recipe and system thereof

Systems, methods and computer program products for signature detection

Patents Applicationslast 30 patents

MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION

MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION

MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN

DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN

MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN

DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN

METHOD OF GENERATING AN EXAMINATION RECIPE AND SYSTEM THEREOF

SYSTEMS, METHODS AND COMPUTER PROGRAM PRODUCTS FOR SIGNATURE DETECTION