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Ariel Tribble
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Fremont, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Computer-implemented methods for detecting and/or sorting defects i...
Patent number
8,111,900
Issue date
Feb 7, 2012
KLA-Tencor Technologies Corp.
Kenong Wu
G01 - MEASURING TESTING
Information
Patent Grant
Computer-implemented methods for detecting and/or sorting defects i...
Patent number
7,729,529
Issue date
Jun 1, 2010
KLA-Tencor Technologies Corp.
Kenong Wu
G01 - MEASURING TESTING
Information
Patent Grant
Flexible hybrid defect classification for semiconductor manufacturing
Patent number
7,142,992
Issue date
Nov 28, 2006
KLA-Tencor Technologies Corp.
Patrick Huet
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
COMPUTER-IMPLEMENTED METHODS FOR DETECTING AND/OR SORTING DEFECTS I...
Publication number
20100226562
Publication date
Sep 9, 2010
KLA-Tencor Technologies Corporation
Kenong Wu
G01 - MEASURING TESTING
Information
Patent Application
Computer-implemented methods for detecting and/or sorting defects i...
Publication number
20060291714
Publication date
Dec 28, 2006
Kenong Wu
G01 - MEASURING TESTING
Information
Patent Application
FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING
Publication number
20060265145
Publication date
Nov 23, 2006
Patrick Huet
G06 - COMPUTING CALCULATING COUNTING