Arijit Raychowhury

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Calcutta, IN

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Patents Grantslast 30 patents

Information Patent Grant
Low power scan design and delay fault testing technique using first...
- Patent number 7,319,343
- Issue date Jan 15, 2008
- Purdue Research Foundation - Purdue University
- Swarup Bhunia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Low power scan design and delay fault testing technique using first...
- Publication number 20060220679
- Publication date Oct 5, 2006
- Purdue Research Foundation-Purdue University
- Swarup Bhunia
- G01 - MEASURING TESTING