Aritomo Kikuchi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic component handling apparatus, electronic component testi...
- Patent number 11,496,227
- Issue date Nov 8, 2022
- Advantest Corporation
- Natsuki Shiota
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 11,353,502
- Issue date Jun 7, 2022
- Advantest Corporation
- Masataka Onozawa
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus, electronic component testi...
- Patent number 11,287,468
- Issue date Mar 29, 2022
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor testing device
- Patent number 10,823,788
- Issue date Nov 3, 2020
- Advantest Corporation
- Yuki Endo
- G01 - MEASURING TESTING
Information Patent Grant
Detector for detecting position of IC device and method for the same
- Patent number 10,297,043
- Issue date May 21, 2019
- Advantest Corporation
- Masataka Onozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Handler apparatus that conveys a device under test to a test socket...
- Patent number 9,784,789
- Issue date Oct 10, 2017
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus, electronic component testi...
- Patent number 9,778,283
- Issue date Oct 3, 2017
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Actuator, handler apparatus and test apparatus
- Patent number 9,453,874
- Issue date Sep 27, 2016
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus, electronic component testi...
- Patent number 8,941,729
- Issue date Jan 27, 2015
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method of electronic device test apparatus
- Patent number 8,294,759
- Issue date Oct 23, 2012
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Position detecting apparatus, a position detecting method and an el...
- Patent number 7,471,819
- Issue date Dec 30, 2008
- Advantest Corporation
- Masayoshi Ichikawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...
- Publication number 20250076366
- Publication date Mar 6, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...
- Publication number 20250076367
- Publication date Mar 6, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TE...
- Publication number 20250076374
- Publication date Mar 6, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL APPARATUS, TEST APPARATUS, TEMPERATURE CONTROL...
- Publication number 20240288491
- Publication date Aug 29, 2024
- Advantest Corporation
- Aritomo KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS...
- Publication number 20230314500
- Publication date Oct 5, 2023
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ADJUSTING DEVICE, ELECTRONIC COMPONENT HANDLING APPARAT...
- Publication number 20230296666
- Publication date Sep 21, 2023
- Advantest Corporation
- Yuya Yamada
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
- Publication number 20210285999
- Publication date Sep 16, 2021
- Advantest Corporation
- Masataka Onozawa
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...
- Publication number 20210194601
- Publication date Jun 24, 2021
- Advantest Corporation
- Natsuki Shiota
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...
- Publication number 20210190856
- Publication date Jun 24, 2021
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR TESTING DEVICE
- Publication number 20190041470
- Publication date Feb 7, 2019
- Advantest Corporation
- Yuki Endo
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR FOR DETECTING POSITION OF IC DEVICE AND METHOD FOR THE SAME
- Publication number 20180294244
- Publication date Oct 11, 2018
- Advantest Corporation
- Masataka ONOZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Handler Apparatus and Test Apparatus
- Publication number 20150276862
- Publication date Oct 1, 2015
- Advantest Corporation
- Aritomo KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
ACTUATOR, HANDLER APPARATUS AND TEST APPARATUS
- Publication number 20150276852
- Publication date Oct 1, 2015
- Advantest Corporation
- Aritomo KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...
- Publication number 20140111235
- Publication date Apr 24, 2014
- Advantest Corporation
- Aritomo KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...
- Publication number 20110254945
- Publication date Oct 20, 2011
- Advantest Corporation
- Aritomo KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE HANDLING APPARATUS AND ELECTRONIC DEVICE POSITION...
- Publication number 20100310151
- Publication date Dec 9, 2010
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD OF ELECTRONIC DEVICE TEST APPARATUS
- Publication number 20090278926
- Publication date Nov 12, 2009
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
Position detecting apparatus, a position detecting method and an el...
- Publication number 20050249397
- Publication date Nov 10, 2005
- Advantest Corporation
- Masayoshi Ichikawa
- G01 - MEASURING TESTING

Aritomo Kikuchi

Person

Patents Grantslast 30 patents

Electronic component handling apparatus, electronic component testi...

Electronic component handling apparatus and electronic component te...

Electronic component handling apparatus, electronic component testi...

Magnetic sensor testing device

Detector for detecting position of IC device and method for the same

Handler apparatus that conveys a device under test to a test socket...

Electronic component handling apparatus, electronic component testi...

Actuator, handler apparatus and test apparatus

Electronic component handling apparatus, electronic component testi...

Calibration method of electronic device test apparatus

Position detecting apparatus, a position detecting method and an el...

Patents Applicationslast 30 patents

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...

SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TE...

TEMPERATURE CONTROL APPARATUS, TEST APPARATUS, TEMPERATURE CONTROL...

TEMPERATURE CONTROL DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS...

TEMPERATURE ADJUSTING DEVICE, ELECTRONIC COMPONENT HANDLING APPARAT...

ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...

ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...

ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...

MAGNETIC SENSOR TESTING DEVICE

DETECTOR FOR DETECTING POSITION OF IC DEVICE AND METHOD FOR THE SAME

Handler Apparatus and Test Apparatus

ACTUATOR, HANDLER APPARATUS AND TEST APPARATUS

ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...

ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...

ELECTRONIC DEVICE HANDLING APPARATUS AND ELECTRONIC DEVICE POSITION...

CALIBRATION METHOD OF ELECTRONIC DEVICE TEST APPARATUS

Position detecting apparatus, a position detecting method and an el...