Arjan Gijsbertsen

Person

Vucht, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring substrate height
- Patent number 11,662,669
- Issue date May 30, 2023
- ASML Netherlands B.V.
- Andrey Valerievich Rogachevskiy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus and method
- Patent number 9,519,224
- Issue date Dec 13, 2016
- ASML Netherlands B.V.
- Arjan Gijsbertsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE HOLDER, CARRIER SYSTEM COMPRISING A SUBSTRATE HOLDER AND...
- Publication number 20230333488
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Krijn Frederik BUSTRAAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HEIGHT MEASUREMENT METHOD AND HEIGHT MEASUREMENT SYSTEM
- Publication number 20230244153
- Publication date Aug 3, 2023
- ASML NETHERLANDS B.V.
- Andrey Valerievich ROGACHEVSKIY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING LEVEL DATA FOR A SURFACE OF A SUBS...
- Publication number 20230204352
- Publication date Jun 29, 2023
- ASML NETHERLANDS B.V.
- Arjan GIJSBERTSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING A MARK MEASUREMENT SEQUENCE, STAGE APPARATUS...
- Publication number 20220260933
- Publication date Aug 18, 2022
- ASML NETHERLANDS B.V.
- István NAGY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS AND METHOD FOR MEASURING SUBSTRATE HEIGHT
- Publication number 20220244651
- Publication date Aug 4, 2022
- ASML NETHERLANDS B.V.
- Andrey Valerievich ROGACHEVSKIY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic Apparatus and Method
- Publication number 20140313496
- Publication date Oct 23, 2014
- ASML NETHERLANDS B.V.
- Arjan Gijsbertsen
- G01 - MEASURING TESTING

Arjan Gijsbertsen

Person

Patents Grantslast 30 patents

Apparatus and method for measuring substrate height

Lithographic apparatus and method

Patents Applicationslast 30 patents

SUBSTRATE HOLDER, CARRIER SYSTEM COMPRISING A SUBSTRATE HOLDER AND...

HEIGHT MEASUREMENT METHOD AND HEIGHT MEASUREMENT SYSTEM

SYSTEM AND METHOD FOR GENERATING LEVEL DATA FOR A SURFACE OF A SUBS...

METHOD OF DETERMINING A MARK MEASUREMENT SEQUENCE, STAGE APPARATUS...

APPARATUS AND METHOD FOR MEASURING SUBSTRATE HEIGHT

Lithographic Apparatus and Method