Arjan Gijsbertsen

Person

Vucht, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Height measurement method and height measurement system
- Patent number 12,253,807
- Issue date Mar 18, 2025
- ASML Netherlands B.V.
- Andrey Valerievich Rogachevskiy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for measuring substrate height
- Patent number 11,662,669
- Issue date May 30, 2023
- ASML Netherlands B.V.
- Andrey Valerievich Rogachevskiy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus and method
- Patent number 9,519,224
- Issue date Dec 13, 2016
- ASML Netherlands B.V.
- Arjan Gijsbertsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE HOLDER, CARRIER SYSTEM COMPRISING A SUBSTRATE HOLDER AND...
- Publication number 20230333488
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Krijn Frederik BUSTRAAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HEIGHT MEASUREMENT METHOD AND HEIGHT MEASUREMENT SYSTEM
- Publication number 20230244153
- Publication date Aug 3, 2023
- ASML NETHERLANDS B.V.
- Andrey Valerievich ROGACHEVSKIY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING LEVEL DATA FOR A SURFACE OF A SUBS...
- Publication number 20230204352
- Publication date Jun 29, 2023
- ASML NETHERLANDS B.V.
- Arjan GIJSBERTSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING A MARK MEASUREMENT SEQUENCE, STAGE APPARATUS...
- Publication number 20220260933
- Publication date Aug 18, 2022
- ASML NETHERLANDS B.V.
- István NAGY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS AND METHOD FOR MEASURING SUBSTRATE HEIGHT
- Publication number 20220244651
- Publication date Aug 4, 2022
- ASML NETHERLANDS B.V.
- Andrey Valerievich ROGACHEVSKIY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic Apparatus and Method
- Publication number 20140313496
- Publication date Oct 23, 2014
- ASML NETHERLANDS B.V.
- Arjan Gijsbertsen
- G01 - MEASURING TESTING

Arjan Gijsbertsen

Person

Patents Grantslast 30 patents

Height measurement method and height measurement system

Apparatus and method for measuring substrate height

Lithographic apparatus and method

Patents Applicationslast 30 patents

SUBSTRATE HOLDER, CARRIER SYSTEM COMPRISING A SUBSTRATE HOLDER AND...

HEIGHT MEASUREMENT METHOD AND HEIGHT MEASUREMENT SYSTEM

SYSTEM AND METHOD FOR GENERATING LEVEL DATA FOR A SURFACE OF A SUBS...

METHOD OF DETERMINING A MARK MEASUREMENT SEQUENCE, STAGE APPARATUS...

APPARATUS AND METHOD FOR MEASURING SUBSTRATE HEIGHT

Lithographic Apparatus and Method