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Arjun Kumar
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Kedah Darul Aman, MY
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last 30 patents
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Patent Grant
Via etch monitoring
Patent number
7,262,608
Issue date
Aug 28, 2007
Silterra Malaysia Sdn. Bhd.
Chin B. Cheah
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Via etch monitoring
Publication number
20060132148
Publication date
Jun 22, 2006
Chin B. Cheah
G01 - MEASURING TESTING