Arkady Nikitin

Person

Yonkers, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of precision measurements of sizes and line width roughness...
- Patent number 7,427,756
- Issue date Sep 23, 2008
- General Phosphorix, LLC
- Arkady Nikitin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of precision calibration of a microscope and the like
- Patent number 7,209,596
- Issue date Apr 24, 2007
- General Phosphorix, LLC
- Arkady Nikitin
- G02 - OPTICS
Information Patent Grant
Method of calibration of magnification of microscopes having differ...
- Patent number 7,054,000
- Issue date May 30, 2006
- General Phosphorix LLC
- Arkady Nikitin
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling removal of photoresist in openings of a photo...
- Patent number 6,982,138
- Issue date Jan 3, 2006
- General Phosphorix, LLC
- Arkady Nikitin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of determining of true nonlinearity of scan along a selected...
- Patent number 6,978,215
- Issue date Dec 20, 2005
- General Phosphorix LLC
- Arkady Nikitin
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating of a scanning electron microscope for precise...
- Patent number 6,969,852
- Issue date Nov 29, 2005
- General Phoshonix LLC
- Dmitriy Yeremin
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a line edge roughness of micro objects in scann...
- Patent number 6,909,791
- Issue date Jun 21, 2005
- General Phosphorix, LLC
- Arkady Nikitin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring sizes in scan microscopes
- Patent number 6,878,935
- Issue date Apr 12, 2005
- General Phosphorix
- Arkady Nikitin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of precision calibration of magnification of a scanning micr...
- Patent number 6,686,587
- Issue date Feb 3, 2004
- General Phosphorix LLC
- Arkady Nikitin
- G02 - OPTICS
Information Patent Grant
Method of precision calibration of magnification of scanning micros...
- Patent number 6,664,532
- Issue date Dec 16, 2003
- General Phosphorix LLC
- Dmitriy Yeremin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simple method of precision calibration of magnification of a scanni...
- Patent number 6,608,294
- Issue date Aug 19, 2003
- General Phosphorix, LLC
- Arkady Nikitin
- G02 - OPTICS
Information Patent Grant
Method of precision calibration of magnification of a scanning micr...
- Patent number 6,573,500
- Issue date Jun 3, 2003
- General Phosphorix LLC
- Dmitriy Yeremin
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Method of determination of resolution of scanning electron microscope
- Publication number 20090121131
- Publication date May 14, 2009
- Arkady Nikitin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of determining micro- and nano- sizes in scanning electron m...
- Publication number 20080114561
- Publication date May 15, 2008
- Dmitriy Yeremin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of precision measurements of sizes and line width roughness...
- Publication number 20070081727
- Publication date Apr 12, 2007
- Arkady Nikitin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of measuring an area of micro-objects of arbitrary shape in...
- Publication number 20070081742
- Publication date Apr 12, 2007
- Dmitriy Yeremin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Device for and a method measuring sizes on photomasks
- Publication number 20060139456
- Publication date Jun 29, 2006
- Arkady Nikitin
- G02 - OPTICS
Information Patent Application
Method of precision calibration of a microscope and the like
- Publication number 20050220362
- Publication date Oct 6, 2005
- Arkady Nikitin
- G02 - OPTICS
Information Patent Application
METHOD OF EVALUATING OF A SCANNING ELECTRON MICROSCOPE FOR PRECISE...
- Publication number 20050205777
- Publication date Sep 22, 2005
- Dmitriy Yeremin
- G01 - MEASURING TESTING
Information Patent Application
Method of controlling removal of photoresist in openings of a photo...
- Publication number 20050032004
- Publication date Feb 10, 2005
- Arkady Nikitin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of calibration of magnification of microscopes having differ...
- Publication number 20050030530
- Publication date Feb 10, 2005
- Arkady Nikitin
- G02 - OPTICS
Information Patent Application
Method of measuring sizes in scan microscopes
- Publication number 20040021075
- Publication date Feb 5, 2004
- Arkady Nikitin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of measuring a line edge roughness of micro objects in scann...
- Publication number 20030190069
- Publication date Oct 9, 2003
- Arkady Nikitin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Simple method of precision calibration of magnification of a scanni...
- Publication number 20030071191
- Publication date Apr 17, 2003
- Arkady Nikitin
- G02 - OPTICS
Information Patent Application
Method of determination of true nonlinearity of scan along a select...
- Publication number 20030055588
- Publication date Mar 20, 2003
- Arkady Nikitin
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method of precision calibration of magnification of scanning micros...
- Publication number 20030034437
- Publication date Feb 20, 2003
- Dmitriy Yeremin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of precision calibration of magnification of a scanning micr...
- Publication number 20030029997
- Publication date Feb 13, 2003
- Dmitriy Yeremin
- G02 - OPTICS
Information Patent Application
Method of precision calibration of magnification of a scanning micr...
- Publication number 20020179829
- Publication date Dec 5, 2002
- Arkady Nikitin
- G02 - OPTICS

Arkady Nikitin

Person

Patents Grantslast 30 patents

Method of precision measurements of sizes and line width roughness...

Method of precision calibration of a microscope and the like

Method of calibration of magnification of microscopes having differ...

Method of controlling removal of photoresist in openings of a photo...

Method of determining of true nonlinearity of scan along a selected...

Method of evaluating of a scanning electron microscope for precise...

Method of measuring a line edge roughness of micro objects in scann...

Method of measuring sizes in scan microscopes

Method of precision calibration of magnification of a scanning micr...

Method of precision calibration of magnification of scanning micros...

Simple method of precision calibration of magnification of a scanni...

Method of precision calibration of magnification of a scanning micr...

Patents Applicationslast 30 patents

Method of determination of resolution of scanning electron microscope

Method of determining micro- and nano- sizes in scanning electron m...

Method of precision measurements of sizes and line width roughness...

Method of measuring an area of micro-objects of arbitrary shape in...

Device for and a method measuring sizes on photomasks

Method of precision calibration of a microscope and the like

METHOD OF EVALUATING OF A SCANNING ELECTRON MICROSCOPE FOR PRECISE...

Method of controlling removal of photoresist in openings of a photo...

Method of calibration of magnification of microscopes having differ...

Method of measuring sizes in scan microscopes

Method of measuring a line edge roughness of micro objects in scann...

Simple method of precision calibration of magnification of a scanni...

Method of determination of true nonlinearity of scan along a select...

Method of precision calibration of magnification of scanning micros...

Method of precision calibration of magnification of a scanning micr...

Method of precision calibration of magnification of a scanning micr...