Arley Cleveland Marley

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Current-perpendicular-to-the-plane (CPP) magnetoresistive (MR) sens...
- Patent number 8,638,530
- Issue date Jan 28, 2014
- HGST Netherlands B.V.
- Yimin Hsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Technique for measuring process induced magnetic anisotropy in a ma...
- Patent number 8,254,066
- Issue date Aug 28, 2012
- Hitachi Global Storage Technologies Netherlands B.V.
- Yimin Hsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Wafer level balanced capacitance design for magnetic heads
- Patent number 8,089,295
- Issue date Jan 3, 2012
- Hitachi Global Storage Technologies Netherlands B.V.
- Arley Cleveland Marley
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic hard magnet thickness adjustment for reduced variation in f...
- Patent number 8,066,897
- Issue date Nov 29, 2011
- Hitachi Global Storage Technologies Netherlands B.V.
- Arley Cleveland Marley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Wafer level testing
- Patent number 7,999,566
- Issue date Aug 16, 2011
- Hitachi Global Storage Technologies, Netherlands B.V.
- Robert S. Beach
- G11 - INFORMATION STORAGE
Information Patent Grant
System and apparatus for electrically testing lead-to-lead shorting...
- Patent number 7,737,703
- Issue date Jun 15, 2010
- Hitachi Global Storage Technologies Netherlands B.V.
- Arley Cleveland Marley
- G01 - MEASURING TESTING
Information Patent Grant
Determination of magnetic read head properties
- Patent number 7,564,235
- Issue date Jul 21, 2009
- Hitachi Global Storage Technologies Netherlands B.V.
- Robert S. Beach
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for electrically testing lead-to-lead...
- Patent number 7,282,376
- Issue date Oct 16, 2007
- Hitachi Global Storage Technologies Netherlands B.V.
- Arley Cleveland Marley
- G01 - MEASURING TESTING
Information Patent Grant
Determination of track width of magnetoresistive sensors during mag...
- Patent number 6,515,475
- Issue date Feb 4, 2003
- International Business Machines Corporation
- Wolfgang Goubau
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUE FOR MEASURING PROCESS INDUCED MAGNETIC ANISOTROPY IN A MA...
- Publication number 20100166943
- Publication date Jul 1, 2010
- Yimin Hsu
- G01 - MEASURING TESTING
Information Patent Application
Wafer level testing
- Publication number 20090167333
- Publication date Jul 2, 2009
- Robert S. Beach
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL BALANCED CAPACITANCE DESIGN FOR MAGNETIC HEADS
- Publication number 20090168259
- Publication date Jul 2, 2009
- ARLEY CLEVELAND MARLEY
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC HARD MAGNET THICKNESS ADJUSTMENT FOR REDUCED VARIATION IN F...
- Publication number 20090166331
- Publication date Jul 2, 2009
- Arley Cleveland Marley
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF MAGNETIC READ HEAD PROPERTIES
- Publication number 20080036455
- Publication date Feb 14, 2008
- Robert S. Beach
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND APPARATUS FOR ELECTRICALLY TESTING LEAD-TO-LEAD SHORTING...
- Publication number 20070290694
- Publication date Dec 20, 2007
- Arley Cleveland Marley
- G01 - MEASURING TESTING
Information Patent Application
System, method, and apparatus for electrically testing lead-to-lead...
- Publication number 20060098367
- Publication date May 11, 2006
- Hitachi Global Storage Technologies Netherlands B.V.
- Arley Cleveland Marley
- G01 - MEASURING TESTING
Information Patent Application
Determination of track width of magnetoresistive sensors during mag...
- Publication number 20020112343
- Publication date Aug 22, 2002
- Wolfgang Goubau
- B24 - GRINDING POLISHING

Arley Cleveland Marley

Person

Patents Grantslast 30 patents

Current-perpendicular-to-the-plane (CPP) magnetoresistive (MR) sens...

Technique for measuring process induced magnetic anisotropy in a ma...

Wafer level balanced capacitance design for magnetic heads

Dynamic hard magnet thickness adjustment for reduced variation in f...

Wafer level testing

System and apparatus for electrically testing lead-to-lead shorting...

Determination of magnetic read head properties

System, method, and apparatus for electrically testing lead-to-lead...

Determination of track width of magnetoresistive sensors during mag...

Patents Applicationslast 30 patents

TECHNIQUE FOR MEASURING PROCESS INDUCED MAGNETIC ANISOTROPY IN A MA...

Wafer level testing

WAFER LEVEL BALANCED CAPACITANCE DESIGN FOR MAGNETIC HEADS

DYNAMIC HARD MAGNET THICKNESS ADJUSTMENT FOR REDUCED VARIATION IN F...

DETERMINATION OF MAGNETIC READ HEAD PROPERTIES

SYSTEM AND APPARATUS FOR ELECTRICALLY TESTING LEAD-TO-LEAD SHORTING...

System, method, and apparatus for electrically testing lead-to-lead...

Determination of track width of magnetoresistive sensors during mag...