Armin Holle

Person

Achim, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for measuring a tubular strand
- Patent number 12,064,911
- Issue date Aug 20, 2024
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring a tubular strand
- Patent number 12,055,386
- Issue date Aug 6, 2024
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Grant
Laser spot control in maldi mass spectrometers
- Patent number 8,872,103
- Issue date Oct 28, 2014
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjusting the detector amplification in mass spectrometers
- Patent number 8,536,519
- Issue date Sep 17, 2013
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexing daughter ion spectrum acquisition from MALDI ionization
- Patent number 8,294,086
- Issue date Oct 23, 2012
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometry for small molecules in two-dimensional sa...
- Patent number 8,274,042
- Issue date Sep 25, 2012
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cleaned daughter ion spectra from maldi ionization
- Patent number 7,989,759
- Issue date Aug 2, 2011
- Bruker Daltonik GmbH
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Grant
Automatic cleaning of MALDI ion sources
- Patent number 7,989,762
- Issue date Aug 2, 2011
- Bruker Daltonik GmbH
- Armin Holle
- B08 - CLEANING
Information Patent Grant
Automatic cleaning of ion sources
- Patent number 7,541,597
- Issue date Jun 2, 2009
- Bruker Daltonik, GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source using matrix-assisted laser desorption/ionization
- Patent number 7,408,152
- Issue date Aug 5, 2008
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser system for the ionization of a sample by matrix-assisted lase...
- Patent number 7,385,192
- Issue date Jun 10, 2008
- Bruker Daltonik, GmbH
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Daughter ion spectra with time-of-flight mass spectrometers
- Patent number 7,301,145
- Issue date Nov 27, 2007
- Bruker Daltonik, GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for cleaning desorption ion sources
- Patent number 7,297,942
- Issue date Nov 20, 2007
- Bruker Daltonik, GmbH
- Armin Holle
- B08 - CLEANING
Information Patent Grant
Laser system for the ionization of a sample by matrix-assisted lase...
- Patent number 7,235,781
- Issue date Jun 26, 2007
- Bruker Daltonik GmbH
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Space-angle focusing reflector for time-of-flight mass spectrometers
- Patent number 6,740,872
- Issue date May 25, 2004
- Brukder Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer with multiplex operation
- Patent number 6,734,421
- Issue date May 11, 2004
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput of laser desorption mass spectra in time-of-flight...
- Patent number 6,723,983
- Issue date Apr 20, 2004
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clean daughter-ion spectra using time-of-flight mass spectrometers
- Patent number 6,717,131
- Issue date Apr 6, 2004
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for generating improved daughter-ion spectra u...
- Patent number 6,703,608
- Issue date Mar 9, 2004
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Daughter ion spectra with time-of-flight mass spectrometers
- Patent number 6,300,627
- Issue date Oct 9, 2001
- Bruker Daltonik GmbH
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustment of the sample support in time-of-flight mass spectrometers
- Patent number 5,910,656
- Issue date Jun 8, 1999
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accurate mass determination with maldi time-of-flight mass spectrom...
- Patent number 5,886,345
- Issue date Mar 23, 1999
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for introduction of sample supports into a mass s...
- Patent number 5,841,136
- Issue date Nov 24, 1998
- Bruker-Franzen Analytik, GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of improving mass resolution in time-of-flight mass spectrom...
- Patent number 5,742,049
- Issue date Apr 21, 1998
- Bruker-Franzen Analytik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass resolution in time-of-flight mass spectrometers with reflectors
- Patent number 5,654,545
- Issue date Aug 5, 1997
- Bruker-Franzen Analytik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improved mass resolution with a TOF-LD source
- Patent number 5,641,959
- Issue date Jun 24, 1997
- Bruker-Franzen Analytik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection of very large molecular ions in a time-of-flight mass spe...
- Patent number 5,463,218
- Issue date Oct 31, 1995
- Bruker-Franzen Analytik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for generating ions from thermally unstable, n...
- Patent number 5,294,797
- Issue date Mar 15, 1994
- Bruker Franzen Analytik GmbH
- Ruediger Frey
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR DETECTING DEFECTS OF A STRAND-LIKE PRODUCT
- Publication number 20240068939
- Publication date Feb 29, 2024
- Sikora AG
- Harold Sikora
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR DETERMINING THE SPEED AND/OR THE LENGTH OF A PRODUCT
- Publication number 20230128231
- Publication date Apr 27, 2023
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING A TUBULAR STRAND
- Publication number 20220268576
- Publication date Aug 25, 2022
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING A TUBULAR STRAND
- Publication number 20210114278
- Publication date Apr 22, 2021
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Application
LASER SPOT CONTROL IN MALDI MASS SPECTROMETERS
- Publication number 20130056628
- Publication date Mar 7, 2013
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADJUSTING THE DETECTOR AMPLIFICATION IN MASS SPECTROMETERS
- Publication number 20090206247
- Publication date Aug 20, 2009
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC CLEANING OF MALDI ION SOURCES
- Publication number 20090200457
- Publication date Aug 13, 2009
- Bruker Daltonik GmbH
- Armin Holle
- B08 - CLEANING
Information Patent Application
MULTIPLEXING DAUGHTER ION SPECTRUM ACQUISITION FROM MALDI IONIZATION
- Publication number 20090101813
- Publication date Apr 23, 2009
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEANED DAUGHTER ION SPECTRA FROM MALDI IONIZATION
- Publication number 20090095903
- Publication date Apr 16, 2009
- Bruker Daltonik GmbH
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Application
IMAGING MASS SPECTROMETRY FOR SMALL MOLECULES IN TWO-DIMENSIONAL SA...
- Publication number 20080296488
- Publication date Dec 4, 2008
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC CLEANING OF ION SOURCES
- Publication number 20070114438
- Publication date May 24, 2007
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser systems for the ionization of a sample by matrix-assisted las...
- Publication number 20060186332
- Publication date Aug 24, 2006
- Bruker Daltonik GmbH
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion source using matrix-assisted laser desorption/ionization
- Publication number 20060169914
- Publication date Aug 3, 2006
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Daughter ion spectra with time-of-flight mass spectrometers
- Publication number 20060108521
- Publication date May 25, 2006
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser system for the ionization of a sample by matrix-assisted lase...
- Publication number 20060071160
- Publication date Apr 6, 2006
- Bruker Daltonik GmbH
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for cleaning desorption ion sources
- Publication number 20040163673
- Publication date Aug 26, 2004
- Bruker Daltonik GmbH
- Armin Holle
- B08 - CLEANING
Information Patent Application
SPACE-ANGLE FOCUSING REFLECTOR FOR TIME-OF-FLIGHT MASS SPECTROMETERS
- Publication number 20040094703
- Publication date May 20, 2004
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Clean daughter-ion spectra using time-of-flight mass spectrometers
- Publication number 20030089848
- Publication date May 15, 2003
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-flight mass spectrometer with multiplex operation
- Publication number 20020155483
- Publication date Oct 24, 2002
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High throughput of laser desorption mass spectra in time-of-flight...
- Publication number 20020145110
- Publication date Oct 10, 2002
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for generating improved daughter-ion spectra u...
- Publication number 20020027194
- Publication date Mar 7, 2002
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS

Armin Holle

Person

Patents Grantslast 30 patents

Method and device for measuring a tubular strand

Method and device for measuring a tubular strand

Laser spot control in maldi mass spectrometers

Adjusting the detector amplification in mass spectrometers

Multiplexing daughter ion spectrum acquisition from MALDI ionization

Imaging mass spectrometry for small molecules in two-dimensional sa...

Cleaned daughter ion spectra from maldi ionization

Automatic cleaning of MALDI ion sources

Automatic cleaning of ion sources

Ion source using matrix-assisted laser desorption/ionization

Laser system for the ionization of a sample by matrix-assisted lase...

Daughter ion spectra with time-of-flight mass spectrometers

Method and device for cleaning desorption ion sources

Laser system for the ionization of a sample by matrix-assisted lase...

Space-angle focusing reflector for time-of-flight mass spectrometers

Time-of-flight mass spectrometer with multiplex operation

High throughput of laser desorption mass spectra in time-of-flight...

Clean daughter-ion spectra using time-of-flight mass spectrometers

Method and apparatus for generating improved daughter-ion spectra u...

Daughter ion spectra with time-of-flight mass spectrometers

Adjustment of the sample support in time-of-flight mass spectrometers

Accurate mass determination with maldi time-of-flight mass spectrom...

Device and method for introduction of sample supports into a mass s...

Method of improving mass resolution in time-of-flight mass spectrom...

Mass resolution in time-of-flight mass spectrometers with reflectors

Method for improved mass resolution with a TOF-LD source

Detection of very large molecular ions in a time-of-flight mass spe...

Method and apparatus for generating ions from thermally unstable, n...

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR DETECTING DEFECTS OF A STRAND-LIKE PRODUCT

DEVICE FOR DETERMINING THE SPEED AND/OR THE LENGTH OF A PRODUCT

METHOD AND DEVICE FOR MEASURING A TUBULAR STRAND

METHOD AND DEVICE FOR MEASURING A TUBULAR STRAND

LASER SPOT CONTROL IN MALDI MASS SPECTROMETERS

ADJUSTING THE DETECTOR AMPLIFICATION IN MASS SPECTROMETERS

AUTOMATIC CLEANING OF MALDI ION SOURCES

MULTIPLEXING DAUGHTER ION SPECTRUM ACQUISITION FROM MALDI IONIZATION

CLEANED DAUGHTER ION SPECTRA FROM MALDI IONIZATION

IMAGING MASS SPECTROMETRY FOR SMALL MOLECULES IN TWO-DIMENSIONAL SA...

AUTOMATIC CLEANING OF ION SOURCES

Laser systems for the ionization of a sample by matrix-assisted las...

Ion source using matrix-assisted laser desorption/ionization

Daughter ion spectra with time-of-flight mass spectrometers

Laser system for the ionization of a sample by matrix-assisted lase...

Method and device for cleaning desorption ion sources

SPACE-ANGLE FOCUSING REFLECTOR FOR TIME-OF-FLIGHT MASS SPECTROMETERS

Clean daughter-ion spectra using time-of-flight mass spectrometers

Time-of-flight mass spectrometer with multiplex operation

High throughput of laser desorption mass spectra in time-of-flight...

Method and apparatus for generating improved daughter-ion spectra u...