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Armin Liero
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Berlin, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Optical pulse generator and method for operating an optical pulse g...
Patent number
10,802,116
Issue date
Oct 13, 2020
Forschungsverbund Berlin e.V.
Armin Liero
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device and method for selecting optical pulses
Patent number
9,448,423
Issue date
Sep 20, 2016
Forschungsverbund Berlin e.V.
Thomas Hoffmann
G02 - OPTICS
Information
Patent Grant
Device and method for selective transmission of an optical signal
Patent number
8,559,098
Issue date
Oct 15, 2013
Forschungsverbund Berlin e.V.
Andreas Klehr
G02 - OPTICS
Information
Patent Grant
Self-adjusting gate bias network for field effect transistors
Patent number
8,324,971
Issue date
Dec 4, 2012
Forschungsverbund Berlin e.V.
Roland Gesche
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Device, probe, and method for the galvanically decoupled transmissi...
Patent number
7,893,683
Issue date
Feb 22, 2011
Forschungverbund Berlin E.V.
Thomas Hoffmann
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Optical Pulse Generator And Method For Operating An Optical Pulse G...
Publication number
20200033446
Publication date
Jan 30, 2020
FORSCHUNGSVERBUND BERLIN E.V.
Armin Liero
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR SELECTING OPTICAL PULSES
Publication number
20130322806
Publication date
Dec 5, 2013
Thomas HOFFMANN
G02 - OPTICS
Information
Patent Application
Device and Method for Selective Transmission of an Optical Signal
Publication number
20110261439
Publication date
Oct 27, 2011
FORSCHUNGSVERBUND BERLIN E.V.
Andreas Klehr
G02 - OPTICS
Information
Patent Application
SELF-ADJUSTING GATE BIAS NETWORK FOR FIELD EFFECT TRANSISTORS
Publication number
20110181324
Publication date
Jul 28, 2011
Roland Gesche
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Device, Probe, and Method for the Galvanically Decoupled Transmiss...
Publication number
20080290856
Publication date
Nov 27, 2008
Thomas Hoffmann
G01 - MEASURING TESTING