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Arnold Abrera Cruz
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Fremont, CA, US
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last 30 patents
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Patent Grant
Method and apparatus for testing a memory device with a redundant s...
Patent number
7,626,874
Issue date
Dec 1, 2009
Xilinx, Inc.
Yuezhen Fan
G11 - INFORMATION STORAGE
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Patent Grant
Test methodology for direct interconnect with multiple fan-outs
Patent number
6,943,581
Issue date
Sep 13, 2005
Xilinx, Inc.
Arnold Abrera Cruz
G01 - MEASURING TESTING