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Arnold Adams
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Goleta, CA, US
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last 30 patents
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Patent Grant
Thin film thickness measuring method
Patent number
4,899,055
Issue date
Feb 6, 1990
Tencor Instruments
Arnold Adams
G01 - MEASURING TESTING
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Patent Grant
Confocal measuring microscope with automatic focusing
Patent number
4,844,617
Issue date
Jul 4, 1989
Tencor Instruments
Herman F. Kelderman
G02 - OPTICS