Arnold E. Barish

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Pleasant Valley, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect monitor for semiconductor manufacturing capable of performin...
- Patent number 7,235,994
- Issue date Jun 26, 2007
- International Business Machines Corporation
- Arnold E. Barish
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting faults in differential current s...
- Patent number 4,967,151
- Issue date Oct 30, 1990
- International Business Machines Corporation
- Arnold E. Barish
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Defect monitor for semiconductor manufacturing capable of performin...
- Publication number 20060022695
- Publication date Feb 2, 2006
- International Business Machines Corporation
- Arnold E. Barish
- G01 - MEASURING TESTING