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Arnold Giske
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Heidellberg, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Laser scanning microscope and method for determining a position of...
Patent number
12,111,454
Issue date
Oct 8, 2024
Leica Microsystems CMS GmbH
Arnold Giske
G01 - MEASURING TESTING
Information
Patent Grant
Method for adjusting the intensity of a light beam in an optical ar...
Patent number
10,705,356
Issue date
Jul 7, 2020
Leica Microsystems CMS GmbH
Manuel Kremer
G02 - OPTICS
Information
Patent Grant
Method and apparatus for investigating a sample with regard to the...
Patent number
9,274,057
Issue date
Mar 1, 2016
Leica Microsystems CMS GmbH
Juergen Schneider
G01 - MEASURING TESTING
Information
Patent Grant
Phase filters for a scanning microscope
Patent number
9,250,429
Issue date
Feb 2, 2016
Leica Microsystems CMS GmbH
Hilmar Gugel
G02 - OPTICS
Information
Patent Grant
Scanning microscope, and method for light microscopy imaging of a s...
Patent number
9,030,734
Issue date
May 12, 2015
Leica Microsystems CMS GmbH
Werner Knebel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LASER SCANNING MICROSCOPE AND METHOD FOR DETERMINING A POSITION OF...
Publication number
20230008453
Publication date
Jan 12, 2023
Leica Microsystems CMS GmbH
Arnold GISKE
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ARRANGEMENT FOR PULSED ILLUMINATION, METHOD FOR PULSED ILLU...
Publication number
20190339500
Publication date
Nov 7, 2019
Leica Microsystems CMS GmbH
Bernd WIDZGOWSKI
G02 - OPTICS
Information
Patent Application
METHOD FOR ADJUSTING THE INTENSITY OF A LIGHT BEAM IN AN OPTICAL AR...
Publication number
20170351073
Publication date
Dec 7, 2017
Leica Microsystem CMS GmbH
Manuel Kremer
G02 - OPTICS
Information
Patent Application
MICROSCOPE WITH AN ELEMENT FOR CHANGING THE SHAPE OF THE ILLUMINATI...
Publication number
20160216498
Publication date
Jul 28, 2016
Leica Microsystems CMS GmbH
Volker SEYFRIED
G02 - OPTICS
Information
Patent Application
Method and Apparatus for Investigating a Sample with Regard to the...
Publication number
20150123013
Publication date
May 7, 2015
Leica Microsystems CMS GmbH
Juergen Schneider
G02 - OPTICS
Information
Patent Application
Scanning Microscope, and Method for Light Microscopy Imaging of a S...
Publication number
20130335818
Publication date
Dec 19, 2013
Leica Microsystems CMS GmbH
Werner Knebel
G02 - OPTICS
Information
Patent Application
Phase Filters for a Scanning Microscope
Publication number
20120236398
Publication date
Sep 20, 2012
Leica Microsystems CMS GmbH
Hilmar GUGEL
G02 - OPTICS