Arnold Halperin

Person

Cortlandt Manor, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Ionization test for electrical verification
- Patent number 7,808,257
- Issue date Oct 5, 2010
- International Business Machines Corporation
- Christopher W. Cline
- G01 - MEASURING TESTING
Information Patent Grant
Thermal modulation system and method for locating a circuit defect
- Patent number 6,400,128
- Issue date Jun 4, 2002
- International Business Machines Corporation
- Daniel Guidotti
- G01 - MEASURING TESTING
Information Patent Grant
Method to test devices on high performance ULSI wafers
- Patent number 6,337,218
- Issue date Jan 8, 2002
- International Business Machines Corporation
- Cyprian E. Uzoh
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting power plane-to-power plane shorts and I/O net-...
- Patent number 6,242,923
- Issue date Jun 5, 2001
- International Business Machines Corporation
- Michael E. Scaman
- G01 - MEASURING TESTING
Information Patent Grant
Thermal modulation system and method for locating a circuit defect...
- Patent number 6,236,196
- Issue date May 22, 2001
- International Business Machines Corporation
- Daniel Guidotti
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for preventing counterfeiting of high price whole...
- Patent number 6,226,619
- Issue date May 1, 2001
- International Business Machines Corporation
- Arnold Halperin
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method and apparatus for locating power plane shorts using polarize...
- Patent number 6,141,093
- Issue date Oct 31, 2000
- International Business Machines Corporation
- Bernell E. Argyle
- G01 - MEASURING TESTING
Information Patent Grant
Hand held telephone set with separable keyboard
- Patent number 6,115,616
- Issue date Sep 5, 2000
- International Business Machines Corporation
- Arnold Halperin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
In-situ monitoring and control of conductive films by detecting cha...
- Patent number 6,072,313
- Issue date Jun 6, 2000
- International Business Machines Corporation
- Leping Li
- G01 - MEASURING TESTING
Information Patent Grant
Rotary signal coupling for chemical mechanical polishing endpoint d...
- Patent number 5,770,948
- Issue date Jun 23, 1998
- International Business Machines Corporation
- Leping Li
- B24 - GRINDING POLISHING
Information Patent Grant
In-situ monitoring of the change in thickness of films
- Patent number 5,731,697
- Issue date Mar 24, 1998
- International Business Machines Corporation
- Leping Li
- G01 - MEASURING TESTING
Information Patent Grant
Rotary signal coupling for chemical mechanical polishing endpoint d...
- Patent number 5,663,637
- Issue date Sep 2, 1997
- International Business Machines Corporation
- Leping Li
- B24 - GRINDING POLISHING
Information Patent Grant
In-situ monitoring of conductive films on semiconductor wafers
- Patent number 5,660,672
- Issue date Aug 26, 1997
- International Business Machines Corporation
- Leping Li
- G01 - MEASURING TESTING
Information Patent Grant
Chemical mechanical polishing endpoint process control
- Patent number 5,659,492
- Issue date Aug 19, 1997
- International Business Machines Corporation
- Leping Li
- B24 - GRINDING POLISHING
Information Patent Grant
Endpoint detection for chemical mechanical polishing using frequenc...
- Patent number 5,644,221
- Issue date Jul 1, 1997
- International Business Machines Corporation
- Leping Li
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing and fault isolation of high density p...
- Patent number 5,621,327
- Issue date Apr 15, 1997
- International Business Machines Corporation
- Shinwu Chiang
- G01 - MEASURING TESTING
Information Patent Grant
In-situ monitoring of the change in thickness of films
- Patent number 5,559,428
- Issue date Sep 24, 1996
- International Business Machines Corporation
- Leping Li
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing and fault isolation of high density p...
- Patent number 5,402,072
- Issue date Mar 28, 1995
- International Business Machines Corporation
- Shinwu Chiang
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection using intermodulation signals
- Patent number 4,868,506
- Issue date Sep 19, 1989
- International Business Machines Corporation
- Thomas H. DiStefano
- G01 - MEASURING TESTING
Information Patent Grant
Nonlinearity detection using fault-generated second harmonic
- Patent number 4,496,900
- Issue date Jan 29, 1985
- International Business Machines Corporation
- Thomas H. Di Stefano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Ionization test for electrical verification
- Publication number 20070108984
- Publication date May 17, 2007
- International Business Machines Corporation
- Christopher W. Cline
- G01 - MEASURING TESTING
Information Patent Application
Thermal modulation system and method for locating a circuit defect
- Publication number 20010035748
- Publication date Nov 1, 2001
- Daniel Guidotti
- G01 - MEASURING TESTING

Arnold Halperin

Person

Patents Grantslast 30 patents

Ionization test for electrical verification

Thermal modulation system and method for locating a circuit defect

Method to test devices on high performance ULSI wafers

Method for detecting power plane-to-power plane shorts and I/O net-...

Thermal modulation system and method for locating a circuit defect...

Method and system for preventing counterfeiting of high price whole...

Method and apparatus for locating power plane shorts using polarize...

Hand held telephone set with separable keyboard

In-situ monitoring and control of conductive films by detecting cha...

Rotary signal coupling for chemical mechanical polishing endpoint d...

In-situ monitoring of the change in thickness of films

Rotary signal coupling for chemical mechanical polishing endpoint d...

In-situ monitoring of conductive films on semiconductor wafers

Chemical mechanical polishing endpoint process control

Endpoint detection for chemical mechanical polishing using frequenc...

System and method for testing and fault isolation of high density p...

In-situ monitoring of the change in thickness of films

System and method for testing and fault isolation of high density p...

Defect detection using intermodulation signals

Nonlinearity detection using fault-generated second harmonic

Patents Applicationslast 30 patents

Ionization test for electrical verification

Thermal modulation system and method for locating a circuit defect