Arnost Neugroschel

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Gainesville, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing and diagnosing MOS transistors
- Patent number 6,275,059
- Issue date Aug 14, 2001
- University of Florida
- Chih-Tang Sah
- G01 - MEASURING TESTING
Information Patent Grant
Oxide charge induced high low junction emitter solar cell
- Patent number 4,483,063
- Issue date Nov 20, 1984
- University of Florida
- Arnost Neugroschel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making quasi-grain boundary-free polycrystalline solar ce...
- Patent number 4,431,858
- Issue date Feb 14, 1984
- University of Florida
- Franklin N. Gonzalez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oxide charge induced high low junction emitter solar cell
- Patent number 4,343,962
- Issue date Aug 10, 1982
- Arnost Neugroschel
- H01 - BASIC ELECTRIC ELEMENTS