Aron CEPLER

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Albany, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Measuring local CD uniformity using scatterometry and machine learning
- Patent number 12,165,023
- Issue date Dec 10, 2024
- Nova Ltd.
- Dexin Kong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hybridization for characterization and metrology
- Patent number 11,295,969
- Issue date Apr 5, 2022
- International Business Machines Corporation
- Gangadhara Raja Muthinti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for use in process control of manufacture of patterned sample
- Patent number 10,534,275
- Issue date Jan 14, 2020
- Nova Measuring Instruments Ltd.
- Cornel Bozdog
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING LOCAL CD UNIFORMITY USING SCATTEROMETRY AND MACHINE LEARNING
- Publication number 20230131932
- Publication date Apr 27, 2023
- NOVA LTD
- Dexin KONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYBRIDIZATION FOR CHARACTERIZATION AND METROLOGY
- Publication number 20200168489
- Publication date May 28, 2020
- International Business Machines Corporation
- GANGADHARA RAJA MUTHINTI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR USE IN PROCESS CONTROL OF MANUFACTURE OF PATTERNED SAMPLE
- Publication number 20180196356
- Publication date Jul 12, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Cornel BOZDOG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY