Aron T. Lunde

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and memory devices for repairing memory cells
- Patent number 8,509,016
- Issue date Aug 13, 2013
- Micron Technology, Inc.
- Aron Lunde
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and memory devices for repairing memory cells
- Patent number 8,144,534
- Issue date Mar 27, 2012
- Micron Technology, Inc.
- Aron Lunde
- G11 - INFORMATION STORAGE
Information Patent Grant
Isolation circuit
- Patent number 7,952,169
- Issue date May 31, 2011
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Grant
Isolation circuit
- Patent number 7,550,762
- Issue date Jun 23, 2009
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Grant
Isolation circuit
- Patent number 7,378,290
- Issue date May 27, 2008
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Grant
Die assembly and method for forming a die on a wafer
- Patent number 7,344,899
- Issue date Mar 18, 2008
- Micron Technology, Inc.
- Aron T. Lunde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combination column redundancy system for a memory array
- Patent number 7,251,173
- Issue date Jul 31, 2007
- Micron Technology, Inc.
- Aron Lunde
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic integrated circuit clusters, modules including same and met...
- Patent number 7,208,758
- Issue date Apr 24, 2007
- Micron Technology, Inc.
- Aron T. Lunde
- G11 - INFORMATION STORAGE
Information Patent Grant
Probe look ahead: testing parts not currently under a probehead
- Patent number 7,170,091
- Issue date Jan 30, 2007
- Micron Technology, Inc.
- Aron T. Lunde
- G11 - INFORMATION STORAGE
Information Patent Grant
Probe look ahead: testing parts not currently under a probehead
- Patent number 7,122,829
- Issue date Oct 17, 2006
- Micron Technology, Inc.
- Aron T. Lunde
- G11 - INFORMATION STORAGE
Information Patent Grant
Isolation circuit
- Patent number 7,026,646
- Issue date Apr 11, 2006
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Grant
Signal sharing circuit with microelectric die isolation features
- Patent number 6,967,348
- Issue date Nov 22, 2005
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Grant
Probe look ahead: testing parts not currently under a probehead
- Patent number 6,630,685
- Issue date Oct 7, 2003
- Micron Technology, Inc.
- Aron T. Lunde
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for properly disabling high current parts in a...
- Patent number 6,522,161
- Issue date Feb 18, 2003
- Micron Technology, Inc.
- Aron T. Lunde
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for properly disabling high current parts in a...
- Patent number 6,275,058
- Issue date Aug 14, 2001
- Micron Technology, Inc.
- Aron T. Lunde
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE HAVING CONTROLLER WITH LOCAL MEMORY
- Publication number 20150286529
- Publication date Oct 8, 2015
- Micron Technology, Inc.
- Aron T. Lunde
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND MEMORY DEVICES FOR REPAIRING MEMORY CELLS
- Publication number 20120176851
- Publication date Jul 12, 2012
- Micron Technology, Inc.
- Aron Lunde
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND MEMORY DEVICES FOR REPAIRING MEMORY CELLS
- Publication number 20110051538
- Publication date Mar 3, 2011
- Micron Technology, Inc.
- Aron Lunde
- G11 - INFORMATION STORAGE
Information Patent Application
ISOLATION CIRCUIT
- Publication number 20090224242
- Publication date Sep 10, 2009
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Application
Combination column redundancy system for a memory array
- Publication number 20070030742
- Publication date Feb 8, 2007
- Micron Technology, Inc.
- Aron Lunde
- G11 - INFORMATION STORAGE
Information Patent Application
Isolation circuit
- Publication number 20060131577
- Publication date Jun 22, 2006
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Application
Probe look ahead: testing parts not currently under a probehead
- Publication number 20060113535
- Publication date Jun 1, 2006
- Micron Technology, Inc.
- Aron T. Lunde
- G01 - MEASURING TESTING
Information Patent Application
Probe look ahead: testing parts not currently under a probehead
- Publication number 20050099862
- Publication date May 12, 2005
- Aron T. Lunde
- G01 - MEASURING TESTING
Information Patent Application
Dynamic integrated circuit clusters, modules including same and met...
- Publication number 20050056945
- Publication date Mar 17, 2005
- Aron T. Lunde
- G11 - INFORMATION STORAGE
Information Patent Application
Dynamic integrated circuit clusters, modules including same and met...
- Publication number 20050059175
- Publication date Mar 17, 2005
- Aron T. Lunde
- G11 - INFORMATION STORAGE
Information Patent Application
Isolation circuit
- Publication number 20050026315
- Publication date Feb 3, 2005
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Application
Isolation circuit
- Publication number 20030234393
- Publication date Dec 25, 2003
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Application
Signal sharing circuit with microelectronic die isolation features
- Publication number 20030235929
- Publication date Dec 25, 2003
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Application
Die assembly and method for forming a die on a wafer
- Publication number 20030137030
- Publication date Jul 24, 2003
- Aron T. Lunde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for properly disabling high current parts in a...
- Publication number 20020049941
- Publication date Apr 25, 2002
- Aron T. Lunde
- G01 - MEASURING TESTING

Aron T. Lunde

Person

Patents Grantslast 30 patents

Methods and memory devices for repairing memory cells

Methods and memory devices for repairing memory cells

Isolation circuit

Isolation circuit

Isolation circuit

Die assembly and method for forming a die on a wafer

Combination column redundancy system for a memory array

Dynamic integrated circuit clusters, modules including same and met...

Probe look ahead: testing parts not currently under a probehead

Probe look ahead: testing parts not currently under a probehead

Isolation circuit

Signal sharing circuit with microelectric die isolation features

Probe look ahead: testing parts not currently under a probehead

Method and apparatus for properly disabling high current parts in a...

Method and apparatus for properly disabling high current parts in a...

Patents Applicationslast 30 patents

MEMORY DEVICE HAVING CONTROLLER WITH LOCAL MEMORY

METHODS AND MEMORY DEVICES FOR REPAIRING MEMORY CELLS

METHODS AND MEMORY DEVICES FOR REPAIRING MEMORY CELLS

ISOLATION CIRCUIT

Combination column redundancy system for a memory array

Isolation circuit

Probe look ahead: testing parts not currently under a probehead

Probe look ahead: testing parts not currently under a probehead

Dynamic integrated circuit clusters, modules including same and met...

Dynamic integrated circuit clusters, modules including same and met...

Isolation circuit

Isolation circuit

Signal sharing circuit with microelectronic die isolation features

Die assembly and method for forming a die on a wafer

Method and apparatus for properly disabling high current parts in a...