Membership
Tour
Register
Log in
Arpit Yati
Follow
Person
Lucknow, IN
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor overlay measurements using machine learning
Patent number
11,967,058
Issue date
Apr 23, 2024
KLA Corporation
Arpit Yati
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for rendering SEM images and predicting defect im...
Patent number
11,880,193
Issue date
Jan 23, 2024
KLA Corporation
Arpit Yati
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for predicting defects and critical dimension u...
Patent number
11,275,361
Issue date
Mar 15, 2022
KLA-Tencor Corporation
Arpit Yati
G05 - CONTROLLING REGULATING
Information
Patent Grant
Deep learning based adaptive regions of interest for critical dimen...
Patent number
11,094,053
Issue date
Aug 17, 2021
KLA Corporation
Arpit Yati
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection-guided critical site selection for critical dimension me...
Patent number
11,035,666
Issue date
Jun 15, 2021
KLA-Tencor Corporation
Jagdish Chandra Saraswatula
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect discovery using electron beam inspection and deep learning w...
Patent number
10,970,834
Issue date
Apr 6, 2021
KLA-Tencor Corporation
Arpit Yati
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Guided scanning electron microscopy metrology based on wafer topogr...
Patent number
10,957,608
Issue date
Mar 23, 2021
KLA-Tencor Corporation
Arpit Yati
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Care areas for improved electron beam defect detection
Patent number
10,692,690
Issue date
Jun 23, 2020
KLA-Tencor Corporation
Vidyasagar Anantha
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automatic deskew using design files or inspection images
Patent number
10,204,416
Issue date
Feb 12, 2019
KLA-Tencor Corporation
Arpit Jain
G01 - MEASURING TESTING
Information
Patent Grant
Range-based real-time scanning electron microscope non-visual binner
Patent number
9,947,596
Issue date
Apr 17, 2018
KLA-Tencor Corporation
Hemanta Kumar Roy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pre-layer defect site review using design
Patent number
9,940,704
Issue date
Apr 10, 2018
KLA-Tencor Corporation
Arpit Yati
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor Overlay Measurements using Machine Learning
Publication number
20210407073
Publication date
Dec 30, 2021
KLA Corporation
Arpit Yati
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and Method for Rendering SEM Images and Predicting Defect Im...
Publication number
20210026338
Publication date
Jan 28, 2021
KLA Corporation
Arpit Yati
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Deep Learning Based Adaptive Regions of Interest for Critical Dimen...
Publication number
20200111206
Publication date
Apr 9, 2020
KLA-Tencor Corporation
Arpit YATI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
REGION OF INTEREST AND PATTERN OF INTEREST GENERATION FOR CRITICAL...
Publication number
20190279914
Publication date
Sep 12, 2019
KLA-Tencor Corporation
Jagdish Chandra Saraswatula
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECT DISCOVERY USING ELECTRON BEAM INSPECTION AND DEEP LEARNING W...
Publication number
20190213733
Publication date
Jul 11, 2019
KLA-Tencor Corporation
Arpit YATI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION-GUIDED CRITICAL SITE SELECTION FOR CRITICAL DIMENSION ME...
Publication number
20190041202
Publication date
Feb 7, 2019
KLA-Tencor Corporation
Jagdish Chandra SARASWATULA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR PREDICTING DEFECTS AND CRITICAL DIMENSION U...
Publication number
20190004504
Publication date
Jan 3, 2019
KLA-Tencor Corporation
Arpit YATI
G05 - CONTROLLING REGULATING
Information
Patent Application
Guided Metrology Based on Wafer Topography
Publication number
20180315670
Publication date
Nov 1, 2018
KLA-Tencor Corporation
Arpit Yati
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Care Areas for Improved Electron Beam Defect Detection
Publication number
20180277337
Publication date
Sep 27, 2018
KLA-Tencor Corporation
Vidyasagar Anantha
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AUTOMATIC DESKEW USING DESIGN FILES OR INSPECTION IMAGES
Publication number
20170228866
Publication date
Aug 10, 2017
KLA-Tencor Corporation
Arpit Jain
G01 - MEASURING TESTING
Information
Patent Application
Range-Based Real-Time Scanning Electron Microscope Non-Visual Binner
Publication number
20170040142
Publication date
Feb 9, 2017
KLA-Tencor Corporation
Hemanta Kumar Roy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PRE-LAYER DEFECT SITE REVIEW USING DESIGN
Publication number
20160371831
Publication date
Dec 22, 2016
KLA-Tencor Corporation
Arpit YATI
G06 - COMPUTING CALCULATING COUNTING