Arseniy KALININ

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Rotterdam, NL

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Patents Applicationslast 30 patents

Information Patent Application
ATOMIC FORCE MICROSCOPE (AFM) DEVICE AND METHOD OF OPERATING THE SAME
- Publication number 20250004010
- Publication date Jan 2, 2025
- Nearfield Instruments B.V.
- Jakob VAN DE LAAR
- G01 - MEASURING TESTING
Information Patent Application
LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCAN...
- Publication number 20240275130
- Publication date Aug 15, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...
- Publication number 20240210443
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN...
- Publication number 20230393169
- Publication date Dec 7, 2023
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE...
- Publication number 20230213552
- Publication date Jul 6, 2023
- Nearfield Instruments B.V.
- Johannes Gradus Martinus KOERS
- G01 - MEASURING TESTING