Arthur Beyder

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Kenmore, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Oscillator for atomic force microscope and other applications
- Patent number 7,533,561
- Issue date May 19, 2009
- Arthur Beyder
- G01 - MEASURING TESTING
Information Patent Grant
Oscillator and method of making for atomic force microscope and oth...
- Patent number 7,340,944
- Issue date Mar 11, 2008
- Arthur Beyder
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Oscillator and method of making for atomic force microscope and oth...
- Publication number 20080128385
- Publication date Jun 5, 2008
- Arthur Beyder
- G01 - MEASURING TESTING
Information Patent Application
Oscillator for atomic force microscope and other applications
- Publication number 20070062265
- Publication date Mar 22, 2007
- Arthur Beyder
- G01 - MEASURING TESTING
Information Patent Application
Oscillator and method of making for atomic force microscope and oth...
- Publication number 20070044545
- Publication date Mar 1, 2007
- Arthur Beyder
- G01 - MEASURING TESTING