Artur DARBINYAN

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing semiconductor devices
- Patent number 11,408,913
- Issue date Aug 9, 2022
- Texas Instruments Incorporated
- Dale Lee Anderson
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing semiconductor devices
- Patent number 10,101,361
- Issue date Oct 16, 2018
- Texas Instruments Incorporated
- Dale Lee Anderson
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level optoelectronic package with fiber side insertion
- Patent number 7,703,993
- Issue date Apr 27, 2010
- National Semiconductor Corporation
- Artur Darbinyan
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Method for Testing Semiconductor Devices
- Publication number 20190120874
- Publication date Apr 25, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Dale Lee Anderson
- G01 - MEASURING TESTING
Information Patent Application
Assembly For Testing Semiconductor Devices
- Publication number 20150130495
- Publication date May 14, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Dale Lee Anderson
- G01 - MEASURING TESTING
Information Patent Application
Method For Testing Semiconductor Devices
- Publication number 20150130496
- Publication date May 14, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Dale Lee Anderson
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL METHOD OF FORMING SIDE FIBER INSERTION OPTOELECTRONIC P...
- Publication number 20100151614
- Publication date Jun 17, 2010
- National Semiconductor Corporation
- Artur DARBINYAN
- G02 - OPTICS