Arulmurugan AMBIKAPATHI

Person

New Taipei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Automated optical inspection and classification apparatus based on...
- Patent number 11,455,528
- Issue date Sep 27, 2022
- Utechzone Co., Ltd.
- Arulmurugan Ambikapathi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method, defect inspection device and defect inspe...
- Patent number 11,017,259
- Issue date May 25, 2021
- Utechzone Co., Ltd.
- Arulmurugan Ambikapathi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection system and method using artificial intelligence
- Patent number 10,991,088
- Issue date Apr 27, 2021
- Utechzone Co., Ltd.
- Arulmurugan Ambikapathi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated optical inspection method using deep learning and apparat...
- Patent number 10,964,004
- Issue date Mar 30, 2021
- Utechzone Co., Ltd.
- Chih-Heng Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for evaluating efficiency of manual inspection fo...
- Patent number 10,878,559
- Issue date Dec 29, 2020
- Utechzone Co., Ltd.
- Chia-Chun Tsou
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR EVALUATING EFFICIENCY OF MANUAL INSPECTION FO...
- Publication number 20200005446
- Publication date Jan 2, 2020
- UTECHZONE CO., LTD.
- Chia-Chun Tsou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION SYSTEM AND METHOD USING ARTIFICIL INTELLIGENCE
- Publication number 20200005449
- Publication date Jan 2, 2020
- UTECHZONE CO., LTD.
- Arulmurugan Ambikapathi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LABELING SYSTEM AND METHOD FOR DEFECT CLASSIFICATION
- Publication number 20200003828
- Publication date Jan 2, 2020
- UTECHZONE CO., LTD.
- ARULMURUGAN AMBIKAPATHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED OPTICAL INSPECTION AND CLASSIFICATION APPARATUS BASED ON...
- Publication number 20200005141
- Publication date Jan 2, 2020
- UTECHZONE CO., LTD.
- ARULMURUGAN AMBIKAPATHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION METHOD, OPTICAL INSPECTION DEVICE AND OPTICAL IN...
- Publication number 20200005070
- Publication date Jan 2, 2020
- UTECHZONE CO., LTD.
- Arulmurugan Ambikapathi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING METHOD OF, AND INSPECTION SYSTEM BASED ON, ITERATIVE DEEP...
- Publication number 20200005084
- Publication date Jan 2, 2020
- UTECHZONE CO., LTD.
- ARULMURUGAN AMBIKAPATHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED OPTICAL INSPECTION METHOD USING DEEP LEARNING AND APPARAT...
- Publication number 20190197679
- Publication date Jun 27, 2019
- UTECHZONE CO., LTD.
- Chih-Heng FANG
- G06 - COMPUTING CALCULATING COUNTING

Arulmurugan AMBIKAPATHI

Person

Patents Grantslast 30 patents

Automated optical inspection and classification apparatus based on...

Defect inspection method, defect inspection device and defect inspe...

Defect inspection system and method using artificial intelligence

Automated optical inspection method using deep learning and apparat...

Method and system for evaluating efficiency of manual inspection fo...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR EVALUATING EFFICIENCY OF MANUAL INSPECTION FO...

DEFECT INSPECTION SYSTEM AND METHOD USING ARTIFICIL INTELLIGENCE

LABELING SYSTEM AND METHOD FOR DEFECT CLASSIFICATION

AUTOMATED OPTICAL INSPECTION AND CLASSIFICATION APPARATUS BASED ON...

OPTICAL INSPECTION METHOD, OPTICAL INSPECTION DEVICE AND OPTICAL IN...

TRAINING METHOD OF, AND INSPECTION SYSTEM BASED ON, ITERATIVE DEEP...

AUTOMATED OPTICAL INSPECTION METHOD USING DEEP LEARNING AND APPARAT...