Arun Ananth Aiyer

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Lewisville, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Self referencing heterodyne reflectometer and method for implementing
- Patent number 7,589,843
- Issue date Sep 15, 2009
- Verity Instruments, Inc.
- Arun Ananth Aiyer
- G01 - MEASURING TESTING
Information Patent Grant
Self referencing heterodyne reflectometer and method for implementing
- Patent number 7,545,503
- Issue date Jun 9, 2009
- Verity Instruments, Inc.
- Arun Ananth Aiyer
- G01 - MEASURING TESTING
Information Patent Grant
Automated overlay metrology system
- Patent number 7,368,206
- Issue date May 6, 2008
- Nikon Corporation
- Bernard Fay
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Self referencing heterodyne reflectometer and method for implementing
- Publication number 20070109551
- Publication date May 17, 2007
- Arun Ananth Aiyer
- G01 - MEASURING TESTING
Information Patent Application
Self referencing heterodyne reflectometer and method for implementing
- Publication number 20070070357
- Publication date Mar 29, 2007
- Arun Ananth Aiyer
- G01 - MEASURING TESTING