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Arunesh ROY
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San Jose, CA, US
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last 30 patents
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Patent Grant
Method and system for multi-chip operation of radar systems
Patent number
11,899,126
Issue date
Feb 13, 2024
UHNDER, INC.
Monier Maher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Distributed aperture automotive radar system
Patent number
11,269,049
Issue date
Mar 8, 2022
NXP USA, INC.
Ryan H. Wu
G01 - MEASURING TESTING
Information
Patent Grant
Extended doppler PMCW code division MIMO radar
Patent number
11,099,267
Issue date
Aug 24, 2021
NXP USA, INC.
Ryan Haoyun Wu
G01 - MEASURING TESTING
Information
Patent Grant
Extended doppler FMCW code division MIMO radar
Patent number
11,054,516
Issue date
Jul 6, 2021
NXP USA, INC.
Ryan Haoyun Wu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
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Patent Application
METHOD AND SYSTEM FOR MULTI-CHIP OPERATION OF RADAR SYSTEMS
Publication number
20240183941
Publication date
Jun 6, 2024
UHNDER, INC.
Monier Maher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DISTRIBUTED APERTURE AUTOMOTIVE RADAR SYSTEM
Publication number
20220187417
Publication date
Jun 16, 2022
NXP USA, Inc.
Ryan Haoyun Wu
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MULTI-CHIP OPERATION OF RADAR SYSTEMS
Publication number
20210215790
Publication date
Jul 15, 2021
UHNDER, INC.
Monier Maher
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR RADAR SENSOR, IC FOR A RADAR SENSOR AND A RADAR SENSOR
Publication number
20200408891
Publication date
Dec 31, 2020
NXP USA, Inc.
Maik Brett
G01 - MEASURING TESTING
Information
Patent Application
Distributed Aperture Automotive Radar System
Publication number
20200300965
Publication date
Sep 24, 2020
NXP USA, Inc.
Ryan H. Wu
G01 - MEASURING TESTING
Information
Patent Application
EXTENDED DOPPLER PMCW CODE DIVISION MIMO RADAR
Publication number
20200191940
Publication date
Jun 18, 2020
NXP USA, Inc.
Ryan Haoyun WU
G01 - MEASURING TESTING
Information
Patent Application
EXTENDED DOPPLER FMCW CODE DIVISION MIMO RADAR
Publication number
20200191939
Publication date
Jun 18, 2020
NXP USA, Inc.
Ryan Haoyun WU
G01 - MEASURING TESTING