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Arvind Chokhani
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Murphy, TX, US
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last 30 patents
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Patent Grant
Diagnosing multicycle transition faults and/or defects with AT-spee...
Patent number
11,892,501
Issue date
Feb 6, 2024
Cadence Design Systems, Inc.
Arvind Chokhani
G01 - MEASURING TESTING
Information
Patent Grant
Utilizing transition ATPG test patterns to detect multicycle faults...
Patent number
11,893,336
Issue date
Feb 6, 2024
Cadence Design Systems, Inc.
Arvind Chokhani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Diagnosing multicycle faults and/or defects with single cycle ATPG...
Patent number
11,740,284
Issue date
Aug 29, 2023
Cadence Design Systems, Inc.
Arvind Chokhani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Utilizing single cycle ATPG test patterns to detect multicycle cell...
Patent number
11,579,194
Issue date
Feb 14, 2023
Cadence Design Systems, Inc.
Arvind Chokhani
G01 - MEASURING TESTING
Information
Patent Grant
SDD ATPG using fault rules files, SDF and node slack for testing an...
Patent number
11,461,520
Issue date
Oct 4, 2022
Cadence Design Systems, Inc.
Arvind Chokhani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Timed transition cell-aware ATPG using fault rule files and SDF for...
Patent number
11,435,401
Issue date
Sep 6, 2022
Cadence Design Systems, Inc.
Arvind Chokhani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fault rules files for testing an IC chip
Patent number
11,429,776
Issue date
Aug 30, 2022
Cadence Design Systems, Inc.
Arvind Chokhani
G06 - COMPUTING CALCULATING COUNTING