Arvind JAIN

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San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated functional and design for testability (DFT) clock delive...
- Patent number 11,934,219
- Issue date Mar 19, 2024
- QUALCOMM Incorporated
- Arvind Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual tap architecture for enabling secure access for DDR memory tes...
- Patent number 11,037,651
- Issue date Jun 15, 2021
- QUALCOMM Incorporated
- Arvind Jain
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY REPAIR SYSTEM AND METHOD
- Publication number 20240087662
- Publication date Mar 14, 2024
- QUALCOMM Incorporated
- HONG DAI
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED FUNCTIONAL AND DESIGN FOR TESTABILITY (DFT) CLOCK DELIVE...
- Publication number 20230315141
- Publication date Oct 5, 2023
- QUALCOMM Incorporated
- Arvind JAIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL TAP ARCHITECTURE FOR ENABLING SECURE ACCESS FOR DDR MEMORY TES...
- Publication number 20200143902
- Publication date May 7, 2020
- QUALCOMM Incorporated
- Arvind JAIN
- G11 - INFORMATION STORAGE