ASAMI NISHIKAWA

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Interconnect structure of semiconductor device
- Patent number 12,207,571
- Issue date Jan 21, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Asami Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device including semiconductor substrate and pixels
- Patent number 11,165,979
- Issue date Nov 2, 2021
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Asami Nishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
INTERCONNECT STRUCTURE, SEMICONDUCTOR DEVICE, METHOD OF OPERATING A...
- Publication number 20250089580
- Publication date Mar 13, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Asami NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
INTERCONNECT STRUCTURE, SEMICONDUCTOR DEVICE, METHOD OF OPERATING A...
- Publication number 20210050513
- Publication date Feb 18, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- Asami NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE
- Publication number 20180352181
- Publication date Dec 6, 2018
- Panasonic Intellectual Property Management Co., Ltd.
- ASAMI NISHIKAWA
- H01 - BASIC ELECTRIC ELEMENTS