Asher Pearl

Person

Hod Hsharon, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for the examination of specimen
- Patent number 7,800,062
- Issue date Sep 21, 2010
- Applied Materials, Inc.
- Alex Goldenshtein
- G01 - MEASURING TESTING
Information Patent Grant
Method of cross-section milling with focused ion beam (FIB) device
- Patent number 7,427,753
- Issue date Sep 23, 2008
- Applied Materials, Israel, Ltd.
- Asher Pearl
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for aligning a charged particle beam column
- Patent number 7,385,205
- Issue date Jun 10, 2008
- Applied Materials Israel Limited
- Asher Pearl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for aligning a charged particle beam column
- Patent number 7,335,893
- Issue date Feb 26, 2008
- Applied Materials Israel Limited
- Asher Pearl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for controlling focused ion beam alignment with a...
- Patent number 7,105,843
- Issue date Sep 12, 2006
- Applied Materials, Israel, Ltd.
- Asher Pearl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source of liquid metal ions and a method for controlling the source
- Patent number 6,914,386
- Issue date Jul 5, 2005
- Applied Materials Israel, Ltd.
- Asher Pearl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam evaluation
- Patent number 6,545,275
- Issue date Apr 8, 2003
- Applied Materials, Inc.
- Asher Pearl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focusing method and system
- Patent number 6,521,891
- Issue date Feb 18, 2003
- Applied Materials, Inc.
- Noam Dotan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR ALIGNING A CHARGED PARTICLE BEAM COLUMN
- Publication number 20070235659
- Publication date Oct 11, 2007
- Applied Materials Israel Limited
- Asher Pearl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of cross-section milling with focused ion beam (FIB) device
- Publication number 20060286772
- Publication date Dec 21, 2006
- Applied Materials Israel Ltd.
- Asher Pearl
- G01 - MEASURING TESTING
Information Patent Application
Method and system for the examination of specimen
- Publication number 20050116164
- Publication date Jun 2, 2005
- Alex Goldenshtein
- G01 - MEASURING TESTING
Information Patent Application
Source of liquid metal ions and a method for controlling the source
- Publication number 20050062480
- Publication date Mar 24, 2005
- Applied Materials, Israel Inc.
- Asher Pearl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for aligning a charged particle beam column
- Publication number 20050006598
- Publication date Jan 13, 2005
- Asher Pearl
- H01 - BASIC ELECTRIC ELEMENTS

Asher Pearl

Person

Patents Grantslast 30 patents

Method and system for the examination of specimen

Method of cross-section milling with focused ion beam (FIB) device

Method and device for aligning a charged particle beam column

Method and device for aligning a charged particle beam column

Method and system for controlling focused ion beam alignment with a...

Source of liquid metal ions and a method for controlling the source

Beam evaluation

Focusing method and system

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR ALIGNING A CHARGED PARTICLE BEAM COLUMN

Method of cross-section milling with focused ion beam (FIB) device

Method and system for the examination of specimen

Source of liquid metal ions and a method for controlling the source

Method and device for aligning a charged particle beam column