Asher Peled

Person

Kfar-Vradim, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Navigation accuracy using camera coupled with detector assembly
- Patent number 12,249,059
- Issue date Mar 11, 2025
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray detection optics for small-angle X-ray scatterometry
- Patent number 10,976,270
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
Wafer alignment for small-angle x-ray scatterometry
- Patent number 10,976,269
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING
Information Patent Grant
X-ray source assembly
- Patent number 9,666,322
- Issue date May 30, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)
- Patent number 9,551,677
- Issue date Jan 24, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Light-emitting intra-cavity interferometric sensors
- Patent number 9,316,592
- Issue date Apr 19, 2016
- Tel Aviv University Future Technology Development Ltd
- Asher Peled
- G01 - MEASURING TESTING
Information Patent Grant
Light-emitting intra-cavity interferometric sensors
- Patent number 8,218,151
- Issue date Jul 10, 2012
- Tel Aviv University Future Technology Development Ltd
- Asher Peled
- G01 - MEASURING TESTING
Information Patent Grant
X-ray measurement of properties of nano-particles
- Patent number 7,680,243
- Issue date Mar 16, 2010
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Target alignment for X-ray scattering measurements
- Patent number 7,600,916
- Issue date Oct 13, 2009
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of X-ray reflectometry system
- Patent number 7,474,732
- Issue date Jan 6, 2009
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
Planar-resonator based optical chemo- and biosensor
- Patent number 7,447,391
- Issue date Nov 4, 2008
- Tel Aviv University Future Technology Ltd.
- Asher Peled
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing resolution of X-ray measurements by sample motion
- Patent number 7,113,566
- Issue date Sep 26, 2006
- Jordan Valley Applied Radiation Ltd.
- Asher Peled
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
navigation accuracy using camera coupled with detector assembly
- Publication number 20230316487
- Publication date Oct 5, 2023
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-ray detection optics for small-angle X-ray scatterometry
- Publication number 20190323974
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
Wafer alignment for small-angle X-ray scatterometry
- Publication number 20190323976
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SOURCE ASSEMBLY
- Publication number 20150243469
- Publication date Aug 27, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANGLE CALIBRATION FOR GRAZING-INCIDENCE X-RAY FLUORESCENCE (GIXRF)
- Publication number 20150204806
- Publication date Jul 23, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-EMITTING INTRA-CAVITY INTERFEROMETRIC SENSORS
- Publication number 20120244633
- Publication date Sep 27, 2012
- Tel Aviv University Future Technology Development, Ltd.
- Asher PELED
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-EMITTING INTRA-CAVITY INTERFEROMETRIC SENSORS
- Publication number 20100231920
- Publication date Sep 16, 2010
- Tel Aviv University Future Technology Development Ltd.
- Asher Peled
- G01 - MEASURING TESTING
Information Patent Application
X-ray measurement of properties of nano-particles
- Publication number 20090067573
- Publication date Mar 12, 2009
- JORDAN VALLEY SEMICONDUCTORS
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Target alignment for x-ray scattering measurements
- Publication number 20070286344
- Publication date Dec 13, 2007
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Planar-Resonator Based Optical Chemo- And Biosensor
- Publication number 20070196043
- Publication date Aug 23, 2007
- TEL AVIV UNIVERSITY FUTURE TECHNOLOGY DEVELOPMENT LTD.
- Asher Peled
- G02 - OPTICS
Information Patent Application
Calibration of X-ray reflectometry system
- Publication number 20060115046
- Publication date Jun 1, 2006
- David Berman
- G01 - MEASURING TESTING

Asher Peled

Person

Patents Grantslast 30 patents

Navigation accuracy using camera coupled with detector assembly

X-ray detection optics for small-angle X-ray scatterometry

Wafer alignment for small-angle x-ray scatterometry

X-ray source assembly

Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)

Light-emitting intra-cavity interferometric sensors

Light-emitting intra-cavity interferometric sensors

X-ray measurement of properties of nano-particles

Target alignment for X-ray scattering measurements

Calibration of X-ray reflectometry system

Planar-resonator based optical chemo- and biosensor

Enhancing resolution of X-ray measurements by sample motion

Patents Applicationslast 30 patents

navigation accuracy using camera coupled with detector assembly

X-ray detection optics for small-angle X-ray scatterometry

Wafer alignment for small-angle X-ray scatterometry

X-RAY SOURCE ASSEMBLY

ANGLE CALIBRATION FOR GRAZING-INCIDENCE X-RAY FLUORESCENCE (GIXRF)

LIGHT-EMITTING INTRA-CAVITY INTERFEROMETRIC SENSORS

LIGHT-EMITTING INTRA-CAVITY INTERFEROMETRIC SENSORS

X-ray measurement of properties of nano-particles

Target alignment for x-ray scattering measurements

Planar-Resonator Based Optical Chemo- And Biosensor

Calibration of X-ray reflectometry system