Ashish Agarwal

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Pittsburgh, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for event detection in plasma processes
- Patent number 7,006,205
- Issue date Feb 28, 2006
- Applied Materials Inc.
- Ashish Agarwal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for event detection in plasma processes
- Publication number 20030223055
- Publication date Dec 4, 2003
- APPLIED MATERIALS, INC.
- Ashish Agarwal
- G01 - MEASURING TESTING